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STDLED625 bảng dữ liệu(PDF) 5 Page - STMicroelectronics |
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STDLED625 bảng dữ liệu(HTML) 5 Page - STMicroelectronics |
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5 / 18 page ![]() DocID025167 Rev 1 5/18 STDLED625, STULED625 Electrical characteristics The built-in back-to-back Zener diodes have been specifically designed to enhance not only the device’s ESD capability, but also to make them capable of safely absorbing any voltage transients that may occasionally be applied from gate to source. In this respect, the Zener voltage is appropriate to achieve efficient and cost-effective protection of device integrity. The integrated Zener diodes thus eliminate the need for external components. Table 6. Switching times Symbol Parameter Test conditions Min. Typ. Max. Unit td(on) Turn-on delay time VDD = 310 V, ID = 2.75 A, RG = 4.7 Ω, VGS = 10 V (see Figure 15) -22 - ns tr Rise time - 12 - ns td(off) Turn-off-delay time - 49 - ns tf Fall time - 20 - ns Table 7. Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 5.5 A ISDM (1) 1. Pulse width limited by safe operating area. Source-drain current (pulsed) 27 A VSD (2) 2. Pulsed: pulse duration = 300 µs, duty cycle 1.5%. Forward on voltage ISD = 5.5 A, VGS = 0 - 1.5 V trr Reverse recovery time ISD = 5.5 A, di/dt = 100 A/µs VDD = 60 V (see Figure 18) -290 ns Qrr Reverse recovery charge - 1900 nC IRRM Reverse recovery current - 13.5 A trr Reverse recovery time ISD = 5.5 A, di/dt = 100 A/µs VDD = 60 V, Tj = 150 °C (see Figure 18) -335 ns Qrr Reverse recovery charge - 2400 nC IRR Reverse recovery current - 14.5 A Table 8. Gate-source Zener diode Symbol Parameter Test conditions Min. Typ. Max. Unit V(BR)GSO Gate-source breakdown voltage IGS = ± 1 mA, ID = 0 30 - - V Obsolete Product(s) - Obsolete Product(s) |
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