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STULED623 bảng dữ liệu(PDF) 5 Page - STMicroelectronics |
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STULED623 bảng dữ liệu(HTML) 5 Page - STMicroelectronics |
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5 / 18 page ![]() DocID025178 Rev 1 5/18 STDLED623, STULED623 Electrical characteristics The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be applied from gate to source. In this respect the Zener voltage is appropriate to achieve efficient and cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the usage of external components. Table 7. Switching times Symbol Parameter Test conditions Min. Typ. Max. Unit td(on) Turn-on delay time VDD = 310 V, ID =1.1 A, RG = 4.7 Ω, VGS = 10 V (see Figure 15) -8 - ns tr Rise time - 4.4 - ns td(off) Turn-off-delay time - 21 - ns tf Fall time - 22 - ns Table 8. Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 2.2 A ISDM (1) 1. Pulse width limited by safe operating area. Source-drain current (pulsed) - 8.8 A VSD (2) 2. Pulsed: Pulse duration = 300 µs, duty cycle 1.5%. Forward on voltage ISD = 2.2 A, VGS = 0 - 1.6 V trr Reverse recovery time ISD = 2.2 A, di/dt = 100 A/µs VDD = 60 V (see Figure 20) - 200 ns Qrr Reverse recovery charge - 900 nC IRRM Reverse recovery current - 9 A trr Reverse recovery time ISD = 2.2 A, di/dt = 100 A/µs VDD = 60 V, Tj = 150 °C (see Figure 20) - 240 ns Qrr Reverse recovery charge - 1150 nC IRRM Reverse recovery current - 10 A Table 9. Gate-source Zener diode Symbol Parameter Test conditions Min. Typ. Max. Unit BVGSO Gate-source breakdown voltage IGS = ± 1 mA (open drain) 30 - - V Obsolete Product(s) - Obsolete Product(s) |
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