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CLC4007ISO14X bảng dữ liệu(PDF) 2 Page - Exar Corporation |
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CLC4007ISO14X bảng dữ liệu(HTML) 2 Page - Exar Corporation |
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2 / 27 page ![]() © 2007-2014 Exar Corporation 2 / 27 exar.com/CLC1007 Rev 1D CLC1007, CLC2007, CLC4007 Absolute Maximum Ratings Stresses beyond the limits listed below may cause permanent damage to the device. Exposure to any Absolute Maximum Rating condition for extended periods may affect device reliability and lifetime. VS ................................................................................. 0V to +14V VIN ............................................................ -VS - 0.5V to +VS +0.5V Operating Conditions Supply Voltage Range .................................................2.7 to 12.6V Operating Temperature Range ...............................-40°C to 125°C Junction Temperature ........................................................... 150°C Storage Temperature Range...................................-65°C to 150°C Lead Temperature (Soldering, 10s) ......................................260°C Package Thermal Resistance θJA (TSOT23-5) ................................................................215°C/W θJA (SOIC-8).....................................................................150°C/W θJA (MSOP-8) .................................................................. 200°C/W θJA (SOIC-14) .................................................................... 90°C/W θJA (TSSOP-14)................................................................100°C/W Package thermal resistance ( θJA), JEDEC standard, multi-layer test boards, still air. ESD Protection TSOT-5 (HBM) ..........................................................................1kV SOIC-8 (HBM) ..........................................................................1kV TSOT-5 (CDM)..........................................................................2kV SOIC-8 (CDM) ..........................................................................2kV ESD Rating for HBM (Human Body Model) and CDM (Charged Device Model). |
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