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TLE8718SA bảng dữ liệu(PDF) 12 Page - Infineon Technologies AG

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Data Sheet
12
Rev. 1.1, 2012-07-31
TLE 8718 SA
General Product Characteristics
Note: Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Note: Integrated protection functions are designed to prevent IC destruction under fault conditions described in the
data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are
not designed for continuous or repetitive operation.
Figure 4
Short Circuit test set-up
4.2.10 Input Pins
DELAYIN, SVBATT
V
DELAYIN_MR,
V
SVBATT_MR
-0.3
40
V
C
–
4.2.11 Current into Pin
SIP, SIN, SI,
FCLP, FCLN, FCL,
SSY, DIS5_10, RST,
DELAYIN, SVBATT, SDO
I
SIP_MR, ISIN_MR, ISI_MR,
I
FCLP_MR, IFCLN_MR,
I
FCL_MR, ISSY_MR,
I
DIS5_10_MR, IRST_MR,
I
DELAYIN_MR,
I
SVBATT_MR, ISDO_MR
-10
10
mA C
1)
4.2.12 Current into Pin DELAYOUT, ABE
I
DELAYOUT_MR, IABE_MR
-10
15
mA C
1)
Temperatures
4.2.13 Junction Temperature
Tj
-40
150
°CC
–
4.2.14 Storage Temperature
T
STG
-55
150
°CC
–
1) Other maximum ratings (like Item 4.2.7 to Item 4.2.10 or Item 4.2.13) are not allowed to be exceeded.
Table 3
Maximum Ratings
T
j = -40°C to +150°C, all voltages with respect to PGND, positive current flowing into pin, unless otherwise
specified
Pos. Parameter
Symbol
Values
Unit TC Conditions
min.
max.
PGND
OUTn
RECU
LHarness
RHarness
VBAT
Short_Circuit_test_setup.vsd
RBAT
LBAT
5µH
20m
Ω
80m
Ω
10m
Ω
0...5µH



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