DP7401

Doc. No. MD-2012 Rev. H

6

© NIDEC COPAL ELECTRONICS CORP.

Characteristics subject to change without notice

Power Up Timing

(1)(2)

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Write Cycle Limits

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Reliability Characteristics

Symbol

Parameter

Reference Test Method

Min

Max

Units

(3)

Endurance

MIL-STD-883, Test Method 1033

1,000,000

Cycles/Byte

(3)

Data Retention

MIL-STD-883, Test Method 1008

100

Years

(3)

ESD Susceptibility

MIL-STD-883, Test Method 3015

2000

V

(3)

A

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0

1

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Figure 1. Synchronous Data Timing

Figure 2. HOLD

¯¯¯¯¯ Timing

Notes:

(1)

This parameter is tested initially and after a design or process change that affects the parameter.

(2)

(3)

This parameter is tested initially and after a design or process change that affects the parameter.

(4)

Dashed Line = mode (1, 1) - - - - - - -

VALID IN

HI-Z

HI-Z

CS

SCK

SI

SO

tFI

CS

SCK

HOLD

SO

HIGH IMPEDANCE