18

3

1

17

4

2

16

5

15

6

14

7

13

8

C

N.C.

D

N.C.

E

12

9

11

10

H

N.C.

20 19

G

N.C.

N.C.

N.C.

H

G

N.C.

N.C.

14

Y

(TOP VIEW)

13

12

11

10

9

8

SN54ALS30A, SN54AS30, SN74ALS30A, SN74AS30

www.ti.com

SDAS010E – APRIL 1982 – REVISED OCTOBER 2012

8-INPUT POSITIVE-NAND GATES

Check for Samples: SN54ALS30A, SN54AS30, SN74ALS30A, SN74AS30

1

FEATURES

DESCRIPTION

•

8-Input Positive-NAND Gates

These devices contain an 8-input positive-NAND gate

•

Available in J, DW, N, and FK Packages

and perform the following Boolean functions in

positive logic:

Y = A • B •C • D • E • F • G • H

or

Y = A + B + C + D + E + F + G

SN54ALS30A, SN54AS30 . . . J PACKAGE

SN54ALS30A, SN54AS30 . . . FK PACKAGE

SN74ALS30A, SN74AS30 . . . DW OR N PACKAGE

(TOP VIEW)

SN74AS30 . . . DB PACKAGE

N.C. – No internal connection

ORDERING INFORMATION

ORDERABLE PART NUMBER

TOP-SIDE MARKING

SN74ALS30AN

SN74ALS30AN

PDIP – N

Tube

SN74AS30N

SN74AS30N

Tube

SN74AS30AD

ALS30A

0°C to 70°C

Tape and reel

SN74ALS30ADR

SOIC – D

Tube

SN74AS30D

AS30

Tape and reel

SN74AS30DR

SSOP – DB

Tape and reel

SN74AS30DBR

AS30

SNJ54ALS30AJ

SNJ54ALS30AJ

CDIP – J

Tube

SNJ54AS30J

SNJ54AS30J

–55°C to 125°C

SNJ54ALS30AFK

SNJ54ALS30AFK

LCCC –FK

Tube

SNJ54AS30FK

SNJ54AS30FK

(1)

Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.

(2)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

website at www.ti.com.

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 1982–2012, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.