LM723HSLASH883 datasheet(4/23 Pages) TI1

4 / 23 page

LM723QML

SNVS310A – FEBRUARY 2005 – REVISED APRIL 2013

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Absolute Maximum Ratings

(1)

Pulse Voltage from V+ to V− (50 ms)

50V

Continuous Voltage from V+ to V−

40V

Input-Output Voltage Differential

40V

Maximum Amplifier Input

Either Input

8.5V

Voltage

Differential

Current from VZ

25 mA

Current from VREF

15 mA

Internal Power Dissipation

Metal

Cavity DIP(2)

900 mW 800 mW

Can(2)

LCCC(2)

900 mW

Operating Temperature Range

−55°C ≤ TA ≤ +125°C

Maximum TJ

+150°C

Storage Temperature Range

−65°C ≤ TA ≤ +150°C

Lead Temperature (Soldering, 4 sec. max.)

300°C

Thermal Resistance

θJA

CDIP (Still Air)

100°C/W

CDIP (500LF/ Min Air flow)

61°C/W

Metal Can (Still Air)

156°C/W

Metal Can (500LF/ Min Air flow)

89°C/W

LCCC (Still Air)

96°C/W

LCCC (500LF/ Min Air flow)

70°C/W

θJC

CDIP

22°C/W

Metal Can

37°C/W

LCCC

27°C/W

ESD Tolerance(3)

500V

(1)

“Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is functional, but do not guarantee specific performance limits. For specified specifications and test conditions, see the

Electrical Characteristics. The specified specifications apply only for the test conditions listed. Some performance characteristics may

degrade when the device is not operated under the listed test conditions.

(2)

The maximum power dissipation for these devices must be derated at elevated temperatures and is dictated by TJMAX, θJA, and the

ambient temperature, TA. The maximum available power dissipation at any temperature is Pd = (TJMAX − TA)/θJA or the number given in

the Absolute Maximum Ratings, whichever is less. See derating curves for maximum power rating above 25°C.

(3)

Human body model, 1.5 k

Ω in series with 100 pF.

Quality Conformance Inspection — MIL-STD-883, Method 5005 — Group A

Subgroup

Description

Temp ( °C)

Static tests at

+25

Static tests at

+125

Static tests at

-55

Dynamic tests at

+25

Dynamic tests at

+125

Dynamic tests at

-55

Functional tests at

+25

Functional tests at

+125

Functional tests at

-55

Switching tests at

+25

Switching tests at

+125

Switching tests at

-55

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