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IXTP2N65X2 bảng dữ liệu(PDF) 2 Page - IXYS Corporation |
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IXTP2N65X2 bảng dữ liệu(HTML) 2 Page - IXYS Corporation |
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2 / 5 page ![]() IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions. IXTY2N65X2 IXTP2N65X2 Note 1. Pulse test, t 300s, duty cycle, d 2%. IXYS MOSFETs and IGBTs are covered 4,835,592 4,931,844 5,049,961 5,237,481 6,162,665 6,404,065B1 6,683,344 6,727,585 7,005,734B2 7,157,338B2 by one or more of the following U.S. patents: 4,860,072 5,017,508 5,063,307 5,381,025 6,259,123B1 6,534,343 6,710,405B2 6,759,692 7,063,975B2 4,881,106 5,034,796 5,187,117 5,486,715 6,306,728B1 6,583,505 6,710,463 6,771,478B2 7,071,537 Source-Drain Diode Symbol Test Conditions Characteristic Values (T J = 25C, Unless Otherwise Specified) Min. Typ. Max I S V GS = 0V 2 A I SM Repetitive, pulse Width Limited by T JM 8 A V SD I F = IS, VGS = 0V, Note 1 1.4 V t rr 137 ns Q RM 508 nC I RM 7.4 A I F = 1A, -di/dt = 100A/μs V R = 100V TO-252 AA Outline 1 - Gate 2,4 - Drain 3 - Source TO-220 Outline 1 - Gate 2,4 - Drain 3 - Source E1 E A D1 D Q L1 oP H1 A1 L A2 D2 e c e1 e1 3X b2 e 3X b EJECTOR PIN Symbol Test Conditions Characteristic Values (T J = 25C, Unless Otherwise Specified) Min. Typ. Max g fs V DS = 10V, ID = 0.5 • ID25, Note 1 1.1 1.8 S R Gi Gate Input Resistance 14 C iss 180 pF C oss V GS = 0V, VDS = 25V, f = 1MHz 129 pF C rss 0.7 pF C o(er) 22 pF C o(tr) 45 pF t d(on) 15 ns t r 19 ns t d(off) 20 ns t f 14 ns Q g(on) 4.3 nC Q gs V GS = 10V, VDS = 0.5 • VDSS, ID = 0.5 • ID25 0.8 nC Q gd 2.1 nC R thJC 2.27 C/W R thCS TO-220 0.50 C/W Resistive Switching Times V GS = 10V, VDS = 0.5 • VDSS, ID = 0.5 • ID25 R G = 50 (External) Effective Output Capacitance Energy related Time related V GS = 0V V DS = 0.8 • VDSS PRELIMINARY TECHNICAL INFORMATION The product presented herein is under development. The Technical Specifications offered are derived from a subjective evaluation of the design, based upon prior knowledge and experi- ence, and constitute a "considered reflection" of the anticipated result. IXYS reserves the right to change limits, test conditions, and dimensions without notice. |
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