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CD74AC20M bảng dữ liệu(PDF) 1 Page - Texas Instruments

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tên linh kiện CD74AC20M
Giải thích chi tiết về linh kiện  Dual 4-input positive-nand gates
PDF  13 Pages
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nhà sản xuất  TI1 [Texas Instruments]
Trang chủ  http://www.ti.com
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CD74AC20M bảng dữ liệu(HTML) 1 Page - Texas Instruments

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CD74AC20
DUAL 4INPUT POSITIVENAND GATES
SCHS229B – SEPTEMBER 1998 – REVISED NOVEMBER 2002
1
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
D AC Types Feature 1.5-V to 5.5-V Operation
and Balanced Noise Immunity at 30% of the
Supply
D Speed of Bipolar F, AS, and S, With
Significantly Reduced Power Consumption
D Balanced Propagation Delays
D ±24-mA Output Drive Current
– Fanout to 15 F Devices
D SCR-Latchup-Resistant CMOS Process and
Circuit Design
D Exceeds 2-kV ESD Protection Per
MIL-STD-883, Method 3015
description/ordering information
The AC device contains two independent 4-input NAND gates. This device performs the Boolean function
Y = A
• B • C • D or Y = A + B + C + D in positive logic.
ORDERING INFORMATION
TA
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
PDIP – E
Tube
CD74AC20E
CD74AC20E
–55
°C to 125°C
SOIC
M
Tube
CD74AC20M
AC20M
55 C to 125 C
SOIC – M
Tape and reel
CD74AC20M96
AC20M
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines
are available at www.ti.com/sc/package.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
A
B
C
D
OUTPUT
Y
H
H
H
H
L
L
XX
X
H
X
LX
X
H
X
XL
X
H
X
X
X
L
H
logic diagram (positive logic)
1A
1Y
1B
1C
1D
2A
2Y
2B
2C
2D
1
2
4
5
9
10
12
13
68
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
NC
1C
1D
1Y
GND
VCC
2D
2C
NC
2B
2A
2Y
E OR M PACKAGE
(TOP VIEW)
Copyright
 2002, Texas Instruments Incorporated
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.


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