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CLC935 bảng dữ liệu(PDF) 6 Page - National Semiconductor (TI) |
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CLC935 bảng dữ liệu(HTML) 6 Page - National Semiconductor (TI) |
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6 / 12 page ![]() http://www.national.com 6 Overdrive Recovery Plots These plots indicate ADC time domain settling from a 50% overdrive condition. A very fast, +1.5V or -1.5V to 0.00V pulse, with a period slightly shorter (100ps) than that of the CONVERT clock, is used as the input source. The ADC is therefore “slipped” through the input wave form and the output data is plotted after being smoothed using a 5 point sliding average. The slip rate (period difference between clock and input) and data point number are used to generate the time axis. For the sake of plot resolution, only fine settling is shown. Analog-to-Digital converters are specified in many ways. As a component achieves higher performance, its specifications and their definitions can become more critical. Fortunately, the vast number of converter applications can generally be placed into one of two classes. These are processed data and non-processed data applications. The distinction seems quite simple but the split implies a completely different approach in specifying A/D converters for a given application. The processed data area includes the frequency domain applications which employ Fourier processing (FFT). Also in this category are the highly averaged applications, usually concerned with low noise. In each case, the converter’s data is averaged or convolved mathematically. This processing reduces the apparent noise level in the output data. For FFTs, the noise is simply spread over a large number of frequency bins. For simple averaging approaches, the Gaussian distribution of noise is greatly reduced, appearing to increase the converter’s resolution. Processed applications include radar, network and spectrum analyzers, communications receivers, etc. The non-processed applications tend to take the convert- er’s data in its original form with very little processing. This means that the noise reduction benefits of the processed applications are not seen. The non- processed area is composed primarily of time domain applications like imaging, DSO’s, ultrasound, etc. The processed vs. non-processed issue has several implications in terms of converter specifications. For the non-processed (time domain) systems the dominant converter specifications deal with noise (SNR) and converter accuracy (DNL). The converter’s quantization noise and input stage noise dominate converter accuracy . The harmonic distortion (primarily INL) of the converter is generally of little interest given that most time domain applications present data for visual analysis and tend to focus on “local” accuracy rather than over the full input range. “Local” accuracy is best described through the standard noise measurements, such as SNR and DNL. In the frequency domain application areas, the noise of the converter is processed to the point where, for almost all systems, it is no longer of issue. This is manifested as a reduction in the apparent noise floor. The actual RMS noise is not reduced, but is spread over more and more frequency bins as processing levels are increased. Unfortunately, the harmonic distortion performance of the converter is not affected by increased processing. This makes the harmonic performance, or more specifically the spurious performance, the dominant error source for frequency domain applications. SFDR becomes the dominant specification for determining converter performance in the frequency domain. Signal-to-Noise Ratio (SNR) is the ratio of the power contained in the fundamental signal compared to the power contained in the entire noise floor. That is to say all individual noise components are added together to arrive at an integrated noise power. For SNR, harmonic power is excluded from the noise measurement. SNR is particularly important in time domain applications like digital image processing and infrared imaging, where conversion accuracy can be heavily degraded by integrated noise. Signal-to-Noise-and-Distortion (SINAD) is the ratio of the fundamental signal power to the power at all other frequencies. This includes all noise as well as all harmonics. SINAD is a worst case specification for A/D converters, combining variables from both frequency and time domains. The value of SINAD in high-performance converter applications is not clear since it does not accurately predict the best converter for a given application. Because data converter applications tend to fall into either noise-sensitive time-domain applications or distortion-sensitive frequency-domain applications, SINAD is not specified for the CLC935 data converter. Total Harmonic Distortion (THD) is the combined power of a specified number of harmonics, compared to the power of the fundamental signal. Harmonics are located at predictable frequencies, spaced at integer multiples of the fundamental signal. For example, a 1MHz fundamental would generate harmonics at 2MHz, 3MHz, 4MHz, ... and so on. In practice, only the first five harmonics contribute significantly to THD, although more may be included in the measurement. THD does not tend to apply well in frequency domain applications which are by their nature very SFDR oriented. In time domain applications, THD is indicative of full-scale input range distortion, however the high-performance time domain applications are generally most interested in local distortion performance. Local distortion and accuracy is dominated by DNL. The use of THD for applications requiring local performance is not likely to yield accurate or repeatable results and therefore THD does not appear in the CLC935 specifications. Understanding A/D Dynamic Specifications |
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