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B57504K0103A009 bảng dữ liệu(PDF) 3 Page - TDK Electronics

tên linh kiện B57504K0103A009
Giải thích chi tiết về linh kiện  Probe assemblies
PDF  9 Pages
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B57504K0103A009 bảng dữ liệu(HTML) 3 Page - TDK Electronics

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Reliability data
Test
Standard
Test conditions
∆R
25/R25
(typical)
Remarks
Storage in
dry heat
IEC
60068-2-2
Storage at max. operating temperature
T: 150
°C
t: 168 h
Medium: air
< 3%
No visible
damage
Storage in
coldness
Storage at lower category temperature
T:
20
°C
t: 1000 h
Medium: air
< 3%
No visible
damage
Storage in damp
heat, steady state
Temperature of air: 60
°C
Relative humidity of air: 93%
Duration: 1000 h
< 3%
No visible
damage
Rapid
temperature
cycling (in water)
Lower test temperature: 15
°C
Upper test temperature: 96
°C
Dwell time: 30 s
Time to change from lower to upper
temperature: <10 s
Number of cycles: 1000
Medium: water
< 3%
No visible
damage
Vibration
resistance
IEC
60068-2-6
Frequency range: 10 to 2000 Hz
Amplitude: 1.5 mm, 10 g
Linear sweep; X, Y and Z direction
Duration: 3
× 2 h
< 3%
No visible
damage
Natural falling
test
Drop sensor 3 times from a height of
75 cm spontaneously onto hard
surface
< 3%
No visible
damage
Boiling test
Storage at 96
°C in water for 6 h, then
natural cooling for 16 h
< 3%
No visible
damage
Note
Contact of NTC thermistors with any liquids and solvents shall be prevented. It must be
ensured that no water enters the NTC thermistors (e.g. through plug terminals).
Avoid dewing and condensation unless thermistor is specified for these conditions.
Temperature measurement
B57504K
Probe assemblies
K504
Page 3 of 9
Please read Cautions and warnings and
Important notes at the end of this document.



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