8

PHYSICAL DESIGN

Using three layers of metal interconnect, Aeroflex achieves

optimized layouts that maximize speed of critical nets, overall

chip performance, and design density up to 500,000 equivalent

gates.

Test Capability

Aeroflex supports all phases of test development from test stim-

ulus generation through high-speed production test. This

support includes ATPG, fault simulation, and fault grading. Scan

design options are available on all UT0.6

CRH storage ele-

ments. Automatic test program development capabilities handle

large vector sets for use with Aeroflex’s Teradyne Tiger tester

supporting high-speed testing (up to 1.2GHz with pin

multiplexing).

Unparalleled Quality and Reliability

Aeroflex is dedicated to meeting the stringent performance re-

quirements of aerospace and defense systems suppliers.

Aeroflex maintains the highest level of quality and reliability

through our Quality Management Program under MIL-PRF-

38535 and ISO-9001. In 1988, we were the first gate array man-

ufacturer to achieve QPL certification and qualification of our

technology families. Our product assurance program has kept

pace with the demands of certification and qualification.

Our quality management plan includes the following activities

and initiatives.

 Quality improvement plan

 Failure analysis program

 SPC plan

 Corrective action plan

 Change control program

 Standard Evaluation Circuit (SEC) and Technology Charac-

terization Vehicle (TCV) assessment program

 Certification and qualification program

Because of numerous product variations permitted with custom-

er specific designs, much of the reliability testing is performed

using a Standard Evaluation Circuit (SEC) and Technology

Characterization Vehicle (TCV). The TCV utilizes test struc-

tures to evaluate hot carrier aging, electromigration, and time

dependent test samples for reliability testing. Data from the wa-

fer-level testing can provide rapid feedback to the fabrication

process, as well as establish the reliability performance of the

product before it is packaged and shipped.

Radiation Tolerance

Aeroflex incorporates radiation-tolerance techniques in process

design, design rules, array design, power distribution, and li-

brary element design. All key radiation-tolerance process

parameters are controlled and monitored using statistical meth-

ods and in-line testing.

Notes:

1. Total dose Co-60 testing is in accordance with MIL-STD-883,

rads(Si

2. Total dose Co-60 testing is in accordance with MIL-STD-883,

Method 1019 at dose rates <1 rad(Si

3. Short pulse 20ns FWHM (full width, half maximum).

4. Is design dependent; SEU limit based on standard evaluation circuit at 4.5V

worst case condition.

PARAMETER

RADIATION

TOLERANCE

NOTES

Total dose

1

2

Dose rate upset

3

Dose rate

survivability

4

SEU

4, 5

Projected

neutron fluence

Latchup

Latchup-immune over speci-

fied use conditions