2

LOGIC DIAGRAM

Notes:

1. Logic will not latchup during radiation exposure within the limits defined in the table.

2. Device storage elements are immune to SEU affects.

PARAMETER

LIMIT

UNITS

Total Dose

1.0E6

rads(Si)

80

SEL Threshold

120

Neutron Fluence

1.0E14

AB

CD

E

F

G

H

(12)

(13)

(14)

(4)

(5)

(6)

(3)

S

C

D

R

(1)

(15)

(2)

CLK INH

CLK

SER

SH/LD

(9)

(7)

S

C

D

R

S

C

D

R

S

C

D

R

S

C

D

R

S

C

D

R

S

C

D

R

S

C

D

R