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LM313 bảng dữ liệu(PDF) 1 Page - Texas Instruments |
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LM313 bảng dữ liệu(HTML) 1 Page - Texas Instruments |
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1 / 10 page ![]() LM113, LM313 www.ti.com SNVS747A – SEPTEMBER 2011 – REVISED MAY 2013 LM113/LM313 Reference Diode Check for Samples: LM113, LM313 1 FEATURES DESCRIPTION The LM113/LM313 are temperature compensated, 2 • Low Breakdown Voltage: 1.220V low voltage reference diodes. They feature extremely- • Dynamic Impedance of 0.3 Ω From 500 μA to 20 tight regulation over a wide range of operating mA currents in addition to an unusually-low breakdown • Temperature Stability Typically 1% Over −55°C voltage and good temperature stability. to 125°C Range (LM113), 0°C to 70°C (LM313) The diodes are synthesized using transistors and • Tight Tolerance: ±5%, ±2% or ±1% resistors in a monolithic integrated circuit. As such, they have the same low noise and long term stability The characteristics of this reference as modern IC op amps. Further, output voltage of the recommend it for use in bias-regulation reference depends only on highly-predictable circuitry, in low-voltage power supplies or in properties of components in the IC; so they can be battery powered equipment. The fact that the manufactured and supplied to tight tolerances. breakdown voltage is equal to a physical property of silicon—the energy-band gap voltage—makes it useful for many temperature-compensation and temperature- measurement functions. Schematic and Connection Diagram Figure 1. Metal Can Package See Package Number NDU 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 2 All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Copyright © 2011–2013, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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