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STM32F446ME bảng dữ liệu(PDF) 103 Page - STMicroelectronics |
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STM32F446ME bảng dữ liệu(HTML) 103 Page - STMicroelectronics |
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103 / 201 page ![]() DocID027107 Rev 5 103/201 STM32F446xC/E Electrical characteristics 174 Low-speed external user clock generated from an external source In bypass mode the LSE oscillator is switched off and the input pin is a standard I/O. The external clock signal has to respect the Table 56: I/O static characteristics. However, the recommended clock input waveform is shown in Figure 24. The characteristics given in Table 38 result from tests performed using an low-speed external clock source, and under ambient temperature and supply voltage conditions summarized in Table 16. Table 37. High-speed external user clock characteristics Symbol Parameter Conditions Min Typ Max Unit fHSE_ext External user clock source frequency(1) - 1- 50 MHz VHSEH OSC_IN input pin high level voltage 0.7VDD -VDD V VHSEL OSC_IN input pin low level voltage VSS -0.3VDD tw(HSE) tw(HSE) OSC_IN high or low time(1) 1. Guaranteed by design. 5- - ns tr(HSE) tf(HSE) OSC_IN rise or fall time(1) -- 10 Cin(HSE) OSC_IN input capacitance(1) -- 5 - pF DuCy(HSE) Duty cycle - 45 - 55 % IL OSC_IN Input leakage current VSS ≤ VIN ≤ VDD -- ±1 µA Table 38. Low-speed external user clock characteristics Symbol Parameter Conditions Min Typ Max Unit fLSE_ext User External clock source frequency(1) - - 32.768 1000 kHz VLSEH OSC32_IN input pin high level voltage 0.7VDD -VDD V VLSEL OSC32_IN input pin low level voltage VSS -0.3VDD tw(LSE) tf(LSE) OSC32_IN high or low time(1) 450 - - ns tr(LSE) tf(LSE) OSC32_IN rise or fall time(1) - - 200 Cin(LSE) OSC32_IN input capacitance(1) -- 5 - pF DuCy(LSE) Duty cycle - 30 - 70 % IL OSC32_IN Input leakage current VSS ≤ VIN ≤ VDD -- ±1 µA 1. Guaranteed by design. |
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