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AL9902FDF-13 bảng dữ liệu(PDF) 4 Page - Diodes Incorporated |
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AL9902FDF-13 bảng dữ liệu(HTML) 4 Page - Diodes Incorporated |
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4 / 18 page ![]() AL9902 Document number: DS37878 Rev. 1 - 2 4 of 18 www.diodes.com July 2015 © Diodes Incorporated AL9902 Electrical Characteristics (@TA = +25°C, unless otherwise specified.) Specifications apply to AL9902 unless otherwise specified Symbol Parameter Conditions Min Typ Max Unit Ishdn Shut-Down Mode Supply Current Pin PWM to GND, VIN = 20V - 0.5 1 mA VDD Internally Regulated Voltage VIN = VIN(MIN)~ 500V, (Note 8) lDD(ext) = 0, Gate pin open 7.2 7.5 8.1 V IDD(ext) VDD Current Available for External Circuitry VIN = 20 to 100V (Note 7) - - 1.0 mA UVLO VDD Under Voltage Lockout Threshold VDD rising 6.4 6.7 7.2 V ∆UVLO VDD Under Voltage Lockout Hysteresis VDD falling - 500 - mV RPWM PWM Pull-Down Resistance VPWM= 5V 150 200 250 kΩ VT MOSFET Threshold Voltage ISW = 0.5A - 4 - V VFD MOSFET Diodes Forward Voltage ID = 0.5A - 0.85 - V VCS(hi) Current Sense Threshold Voltage TA = -40°C to +125°C 237.5 250 262.5 mV fOSC Oscillator Frequency ROSC = 1MΩ 20 25 30 kHz ROSC = 226kΩ 80 100 120 DMAXhf Maximum Oscillator PWM Duty Cycle fPWMhf = 25kHz, at GATE, CS to GND. - - 100 % VLD Linear Dimming Pin Voltage Range TA = <125°C, VIN = 20V 0 - 250 mV TSD Thermal Shut-Down (Junction) Use DFN JA when I SW=0.4A, VDS=1V - 141 - °C TSDH Thermal Shut-Down Hysteresis - - 25 - JA Thermal Resistance Junction-to-Ambient U-DFN6040-12 (Note 8) - 65 - C/W JC Thermal Resistance Junction-to-Case - 5 - C/W JA Thermal Resistance Junction-to-Ambient SO-16 - 100 - C/W JC Thermal Resistance Junction-to-Case - 15 - C/W Notes: 7. Also limited by package power dissipation limit, whichever is lower. 8. Device mounted on FR-4 PCB (25mm x 25mm 1oz copper, minimum recommended pad layout on top. For better thermal performance, larger copper pad for heat-sink is needed. Internal MOSFET Characteristic Symbol Min Typ Max Unit Test Condition OFF CHARACTERISTICS (Note 9) Drain-Source Breakdown Voltage BVDSS 650 — — V VGS = 0V, ID = 250μA Zero Gate Voltage Drain Current IDSS — — 1 µA VDS = 650V, VGS = 0V Gate-Source Leakage IGSS — — ±100 nA VGS = ±30V, VDS = 0V ON CHARACTERISTICS (Note 9) Gate Threshold Voltage VGS(th) 3 — 5 V VDS = VGS, ID = 250μA Static Drain-Source On-Resistance RDS (ON) — 4 5 Ω VGS = 10V, ID = 1A Diode Forward Voltage VSD — 0.7 1 V VGS = 0V, IS = 1A DYNAMIC CHARACTERISTICS (Note 10) Input Capacitance Ciss — 479 — pF VDS = 25V, VGS = 0V, f = 1MHz Output Capacitance Coss — 29 — pF Reverse Transfer Capacitance Crss — 1.9 — pF Gate Resistance Rg — 2 — Ω VDS = 0V, VGS = 0V, f = 1MHz Total Gate Charge Qg — 14 — nC VDS = 520V, VGS = 10V, ID = 2A Gate-Source Charge Qgs — 2.5 — nC Gate-Drain Charge Qgd — 7.3 — nC Turn-On Delay Time tD(on) — 17 — ns VDS = 325V, VGS = 10V, RG = 25Ω, ID = 2.5A Turn-On Rise Time tr — 33 — ns Turn-Off Delay Time tD(off) — 31 — ns Turn-Off Fall Time tf — 25 — ns Body Diode Reverse Recovery Time trr — 174 — ns VDS = 100V, IF = 2A, di/dt = 100A/ μs Body Diode Reverse Recovery Charge Qrr — 884 — nC Notes: 9. Short duration pulse test used to minimize self-heating effect. 10. Guaranteed by design. Not subject to production testing. |
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