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AL9902FDF-13 bảng dữ liệu(PDF) 4 Page - Diodes Incorporated

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AL9902
Document number: DS37878 Rev. 1 - 2
4 of 18
www.diodes.com
July 2015
© Diodes Incorporated
AL9902
Electrical Characteristics (@TA = +25°C, unless otherwise specified.)
Specifications apply to AL9902 unless otherwise specified
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Ishdn
Shut-Down Mode Supply Current
Pin PWM to GND,
VIN = 20V
-
0.5
1
mA
VDD
Internally Regulated Voltage
VIN = VIN(MIN)~ 500V, (Note 8) lDD(ext) = 0,
Gate pin open
7.2
7.5
8.1
V
IDD(ext)
VDD Current Available for External Circuitry VIN = 20 to 100V (Note 7)
-
-
1.0
mA
UVLO
VDD Under Voltage Lockout Threshold
VDD rising
6.4
6.7
7.2
V
∆UVLO
VDD Under Voltage Lockout Hysteresis
VDD falling
-
500
-
mV
RPWM
PWM Pull-Down Resistance
VPWM= 5V
150
200
250
VT
MOSFET Threshold Voltage
ISW = 0.5A
-
4
-
V
VFD
MOSFET Diodes Forward Voltage
ID = 0.5A
-
0.85
-
V
VCS(hi)
Current Sense Threshold Voltage
TA = -40°C to +125°C
237.5
250
262.5
mV
fOSC
Oscillator Frequency
ROSC = 1MΩ
20
25
30
kHz
ROSC = 226kΩ
80
100
120
DMAXhf
Maximum Oscillator PWM Duty Cycle
fPWMhf = 25kHz, at GATE, CS to GND.
-
-
100
%
VLD
Linear Dimming Pin Voltage Range
TA = <125°C, VIN = 20V
0
-
250
mV
TSD
Thermal Shut-Down (Junction)
Use DFN
JA when I
SW=0.4A, VDS=1V
-
141
-
°C
TSDH
Thermal Shut-Down Hysteresis
-
-
25
-
JA
Thermal Resistance Junction-to-Ambient
U-DFN6040-12 (Note 8)
-
65
-
C/W
JC
Thermal Resistance Junction-to-Case
-
5
-
C/W
JA
Thermal Resistance Junction-to-Ambient
SO-16
-
100
-
C/W
JC
Thermal Resistance Junction-to-Case
-
15
-
C/W
Notes:
7. Also limited by package power dissipation limit, whichever is lower.
8. Device mounted on FR-4 PCB (25mm x 25mm 1oz copper, minimum recommended pad layout on top. For better thermal performance, larger
copper pad for heat-sink is needed.
Internal MOSFET Characteristic
Symbol
Min
Typ
Max
Unit
Test Condition
OFF CHARACTERISTICS (Note 9)
Drain-Source Breakdown Voltage
BVDSS
650
V
VGS = 0V, ID = 250μA
Zero Gate Voltage Drain Current
IDSS
1
µA
VDS = 650V, VGS = 0V
Gate-Source Leakage
IGSS
±100
nA
VGS = ±30V, VDS = 0V
ON CHARACTERISTICS (Note 9)
Gate Threshold Voltage
VGS(th)
3
5
V
VDS = VGS, ID = 250μA
Static Drain-Source On-Resistance
RDS (ON)
4
5
Ω
VGS = 10V, ID = 1A
Diode Forward Voltage
VSD
0.7
1
V
VGS = 0V, IS = 1A
DYNAMIC CHARACTERISTICS (Note 10)
Input Capacitance
Ciss
479
pF
VDS = 25V, VGS = 0V,
f = 1MHz
Output Capacitance
Coss
29
pF
Reverse Transfer Capacitance
Crss
1.9
pF
Gate Resistance
Rg
2
Ω
VDS = 0V, VGS = 0V, f = 1MHz
Total Gate Charge
Qg
14
nC
VDS = 520V, VGS = 10V,
ID = 2A
Gate-Source Charge
Qgs
2.5
nC
Gate-Drain Charge
Qgd
7.3
nC
Turn-On Delay Time
tD(on)
17
ns
VDS = 325V, VGS = 10V,
RG = 25Ω, ID = 2.5A
Turn-On Rise Time
tr
33
ns
Turn-Off Delay Time
tD(off)
31
ns
Turn-Off Fall Time
tf
25
ns
Body Diode Reverse Recovery Time
trr
174
ns
VDS = 100V, IF = 2A,
di/dt = 100A/
μs
Body Diode Reverse Recovery Charge
Qrr
884
nC
Notes:
9. Short duration pulse test used to minimize self-heating effect.
10. Guaranteed by design. Not subject to production testing.



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