TL598

PULSEWIDTHMODULATION CONTROL CIRCUITS

SLVS053D − FEBRUARY 1988 − REVISED NOVEMBER 2003

3

POST OFFICE BOX 655303

recommended operating conditions

MIN

MAX

UNIT

VCC

Supply voltage

7

40

V

VI

Amplifier input voltage

0

VCC−2

V

IO

Collector voltage

40

V

IIL

Output current (each output), sink or source

200

mA

Current into feedback terminal

0.3

mA

CT

Timing capacitor

0.00047

10

µF

RT

Timing resistor

1.8

500

k

Ω

fosc

Oscillator frequency

1

300

kHz

TA

Operating free-air temperature

0

70

°C

(unless otherwise noted)

reference section (see Note 4)

PARAMETER

TEST CONDITIONS†

MIN

TYP‡

MAX

UNIT

Output voltage (REF)

IO = 1 mA

TA = 25°C

4.95

5

5.05

V

Output voltage (REF)

IO = 1 mA

TA = full range

4.9

5.1

V

Input regulation

VCC = 7 V to 40 V

TA = 25°C

2

25

mV

Output regulation

IO = 1 mA to 10 mA

TA = 25°C

1

15

mV

Output regulation

IO = 1 mA to 10 mA

TA = full range

50

mV

Output voltage change with temperature

∆TA = MIN to MAX

2

10

mV/V

Short-circuit output current§

REF = 0 V

−10

−48

mA

† Full range is 0°C to 70°C.

‡ All typical values, except for parameter changes with temperature, are at TA = 25°C.

§ Duration of the short circuit should not exceed one second.

NOTE 4: Pulse-testing techniques that maintain the junction temperature as close to the ambient temperature as possible must be used.

PARAMETER

TEST CONDITIONS†

MIN

TYP‡

MAX

UNIT

Frequency

100

kHz

Standard deviation of frequency¶

All values of VCC, CT, RT, TA constant

100

Hz/kHz

Frequency change with voltage

VCC = 7 V to 40 V,

TA = 25°C

1

10

Hz/kHz

Frequency change with temperature#

∆TA = full range

70

120

Hz/kHz

Frequency change with temperature#

∆TA = full range,

CT = 0.01 µF

50

80

Hz/kHz

† Full range is 0°C to 70°C.

‡ All typical values, except for parameter changes with temperature, are at TA = 25°C.

¶ Standard deviation is a measure of the statistical distribution about the mean, as derived from the formula:

# Effects of temperature on external RT and CT are not taken into account.

NOTE 4. Pulse-testing techniques that maintain the junction temperature as close to the ambient temperature as possible must be used.

s +

N

n

+1

(xn * X)

2

N

* 1