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NLSX4402 bảng dữ liệu(PDF) 9 Page - ON Semiconductor |
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NLSX4402 bảng dữ liệu(HTML) 9 Page - ON Semiconductor |
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9 / 13 page ![]() NLSX4402 www.onsemi.com 9 TIMING CHARACTERISTICS − OPEN DRAIN DRIVING CONFIGURATIONS (continued) (I/O test circuit of Figures 5 and 6, CLOAD = 15 pF, driver output impedance ≤ 50 W, RLOAD = 1 MW) Symbol Unit −40 5C to +855C (Notes 6 & 7) Test Conditions Parameter Symbol Unit Max Typ Min Test Conditions Parameter VL = 5.5 V, VCC = 1.5 V tPDVCC−VL Propagation Delay (Driving I/O VCC, VCC to VL) 12 24 ns tEN Enable Time 100 ns tDIS Disable Time 300 ns tPPSKEW Part−to−Part Skew 2 ns MDR Maximum Data Rate 3 Mbps VL = 5.5 V, VCC = 5.5 V tRVCC I/O VCC Rise Time 42 50 ns tFVCC I/O VCC Fall Time 2 3 ns tRVL I/O VL Rise Time 44 48 ns tFVL I/O VL Fall Time 2 3 ns tPDVL−VCC Propagation Delay (Driving I/O VL, VL to VCC) 4 6 ns tPDVCC−VL Propagation Delay (Driving I/O VCC, VCC to VL) 6 9 ns tEN Enable Time 60 ns tDIS Disable Time 225 ns tPPSKEW Part−to−Part Skew 2 ns MDR Maximum Data Rate 7 Mbps Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 6. Typical values are for the specified VL and VCC at TA = +25°C. All units are production tested at TA = +25°C. 7. Limits over the operating temperature range are guaranteed by design. 8. Skew is the variation of propagation delay between output signals and applies only to output signals on the same port (I/O_VLn or I/O_VCCn) and switching with the same polarity (LOW−to−HIGH or HIGH−to−LOW). Skew is defined by applying a single input to the two input channels and measuring the difference in propagation delays between the output channels. |
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