LM5002

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SNVS496D – JANUARY 2007 – REVISED MARCH 2013

Absolute Maximum Ratings

(1) (2)

VIN to GND

76V

SW to GND (Steady State)

-0.3V to 76V

VCC, EN to GND

14V

COMP, FB, RT to GND

-0.3V to 7V

Maximum Junction Temperature

150°C

Storage Temperature

−65°C to +150°C

Human Body Model

2kV

(1)

Absolute maximum ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions for which the

device is intended to be functional, but device parameter specifications may not be ensured. For ensured specifications and test

conditions, see the Electrical Characteristics.

(2)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and

specifications.

(3)

The human body model is a 100 pF capacitor discharged through a 1.5k

Ω resistor into each pin. Test Method is per JESD-22-A114.

Operating Conditions

VIN

3.1V to 75V

Operating Junction Temperature

−40°C to +125°C

Electrical Characteristics

to +125°C. Minimum and Maximum limits are ensured through test, design, or statistical correlation. Typical values represent

otherwise stated

Symbol

Parameter

Conditions

Min

Typ

Max

Units

STARTUP REGULATOR

VCC Regulator Output

6.55

6.85

7.15

V

VCC Current Limit

15

20

mA

VCC UVLO Threshold

2.6

2.8

3

V

VCC Undervoltage Hysteresis

0.1

V

3.1

4.5

mA

95

130

µA

EN THRESHOLDS

EN Shutdown Threshold

0.25

0.45

0.65

V

EN Shutdown Hysteresis

0.1

V

EN Standby Threshold

1.2

1.26

1.32

V

EN Standby Hysteresis

0.1

V

EN Current Source

6

µA

MOSFET CHARACTERISTICS

850

1600

m

Ω

Current Sense Resistance

MOSFET Leakage Current

0.05

5

µA

MOSFET Gate Charge

2.4

nC

CURRENT LIMIT

Cycle by Cycle Current Limit

0.4

0.5

0.6

A

Cycle by Cycle Current Limit Delay

100

200

ns

(1)

Min and Max limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlation

using Statistical Quality Control (SQC) methods. Limits are used to calculate TI’s Average Outgoing Quality Level (AOQL).

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