IR2114/IR2214SSPbF

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© 2009 International Rectifier

21

Figures 25-83 provide information on the experimental performance of the IR2114/IR2214SSPbF HVIC. The line plotted

in each figure is generated from actual lab data. A large number of individual samples from multiple wafer lots were

tested at three temperatures (-40 ºC, 25 ºC, and 125 ºC) in order to generate the experimental (Exp.) curve. The line

labeled Exp. consist of three data points (one data point at each of the tested temperatures) that have been connected

together to illustrate the understood trend. The individual data points on the curve were determined by calculating the

averaged experimental value of the parameter (for a given temperature).

9.95

10.00

10.05

10.10

10.15

10.20

10.25

10.30

-50

-25

0

25

50

75

100

125

Temperature (

Exp.

0

100

200

300

400

500

600

-50

-25

0

25

50

75

100

125

Temperature (

Exp.

0.00

0.10

0.20

0.30

0.40

0.50

0.60

0.70

0.80

0.90

1.00

-50

-25

0

25

50

75

100

125

Temperature (

Exp.

10.00

10.05

10.10

10.15

10.20

10.25

10.30

10.35

10.40

10.45

-50

-25

0

25

50

75

100

125

Temperature (

Exp.

9.25

9.30

9.35

9.40

9.45

9.50

9.55

9.60

9.65

9.70

-50

-25

0

25

50

75

100

125

Temperature (

Exp.

9.15

9.20

9.25

9.30

9.35

9.40

9.45

9.50

9.55

9.60

-50

-25

0

25

50

75

100

125

Temperature (

Exp.