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AMMC-6442 bảng dữ liệu(PDF) 2 Page - AVAGO TECHNOLOGIES LIMITED

tên linh kiện AMMC-6442
Giải thích chi tiết về linh kiện  37 - 40 GHz 1W Power Amplifier
PDF  8 Pages
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nhà sản xuất  AVAGO [AVAGO TECHNOLOGIES LIMITED]
Trang chủ  http://www.avagotech.com
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AMMC-6442 bảng dữ liệu(HTML) 2 Page - AVAGO TECHNOLOGIES LIMITED

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2
Absolute Maximum Ratings[1,2,3,4]
Symbol
Parameters
Unit
Max
Vd
Positive Supply Voltage[2]
V
5.5
Vg
Gate Supply Voltage
V
-2 to 0
PD
Power Dissipation[2]
W6
Pin
CW Input Power[2]
dBm
20
Tch
Operating Channel Temp.[3,4]
°C
+150
Tstg
Storage Case Temp.
°C
-65 to +155
Tmax
Maximum Assembly Temp (30 sec max)
°C
+260
Note:
1. Operation in excess of any one of these conditions may result in permanent damage to this device.
2. Combinations of supply voltage, drain current, input power, and output power shall not exceed PD.
3. These ratings apply to each individual FET
4. The operating channel temperature will directly affect the device MTTF. For maximum life, it is recommended that junction temperatures be
maintained at the lowest possible levels.
DC Specifications/ Physical Properties [1]
Symbol
Parameters and Test Conditions
Unit
Min
Typ
Max
Id(q)
Drain Supply Current
(Vd=5 V, Vg set for Id(q)Typical)
mA
700
Vg
Gate Supply Operating Voltage
(Id(q) = 700 (mA))
V
-1.3
-1
-0.7
Tch-bs
Thermal Resistance
(Channel-to-Base Plate)
°C/W
12
Tch
Channel Temperature
°C
150
Note:
1. Assume die epoxied to evaluation RF module at 92.25°C base plate temperature.
RF Specifications [1, 2]
TA= 25°C, Vdd = 5.0 V, Idq =0.7 A, Vg = -1V, Zo=50
:
Symbol
Parameters and Test Conditions
Units
Minimum
Typical
Maximum
Freq
Operational Frequency
GHz
37
40
Gain
Small-signal Gain [2]
dB
20
23
P-1dB
Output Power at 1dB [2] Gain Compression
dBm
28
30
IM3
Relative third Order Inter-modulation Level
'f=20MHz, Po=+18dBm, SCL
dBc
37
RLin
Input Return Loss
dB
8
RLout
Output Return Loss
dB
8
Isolation
Reverse Isolation
dB
50
Note:
1. Small/Large -signal data measured at TA = 25°C.
2. 100% on wafer RF test is done at frequency= 37, 38 and 40GHz.



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