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2SC6095 bảng dữ liệu(PDF) 2 Page - ON Semiconductor

tên linh kiện 2SC6095
Giải thích chi tiết về linh kiện  Bipolar Transistor 80V, 2.5A, Low VCE(sat), NPN Single PCP
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2SC6095 bảng dữ liệu(HTML) 2 Page - ON Semiconductor

  2SC6095 Datasheet HTML 1Page - ON Semiconductor 2SC6095 Datasheet HTML 2Page - ON Semiconductor 2SC6095 Datasheet HTML 3Page - ON Semiconductor 2SC6095 Datasheet HTML 4Page - ON Semiconductor 2SC6095 Datasheet HTML 5Page - ON Semiconductor 2SC6095 Datasheet HTML 6Page - ON Semiconductor 2SC6095 Datasheet HTML 7Page - ON Semiconductor  
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2SC6095
No. A0411-2/7
Continued from preceding page.
Parameter
Symbol
Conditions
Ratings
Unit
Base Current
IB
500
mA
Collector Dissipation
PC
When mounted on ceramic substrate (250mm2×0.8mm)
1.3
W
Tc=25°C
3.5
W
Junction Temperature
Tj
150
°C
Storage Temperature
Tstg
--55 to +150
°C
Electrical Characteristics at Ta=25°C
Parameter
Symbol
Conditions
Ratings
Unit
min
typ
max
Collector Cutoff Current
ICBO
VCB=70V, IE=0A
1
μA
Emitter Cutoff Current
IEBO
VEB=4V, IC=0A
1
μA
DC Current Gain
hFE
VCE=5V, IC=100mA
300
600
Gain-Bandwidth Product
fT
VCE=10V, IC=500mA
350
MHz
Output Capacitance
Cob
VCB=10V, f=1MHz
14
pF
Collector-to-Emitter Saturation Voltage
VCE(sat)1
IC=1A, IB=50mA
100
150
mV
VCE(sat)2
IC=1A, IB=100mA
90
135
mV
Base-to-Emitter Saturation Voltage
VBE(sat)
IC=1A, IB=100mA
0.9
1.2
V
Collector-to-Base Breakdown Voltage
V(BR)CBO
IC=10μA, IE=0A
120
V
Collector-to-Emitter Breakdown Voltage
V(BR)CES
IC=100μA, RBE=0Ω
120
V
V(BR)CEO
IC=1mA, RBE=∞
80
V
Emitter-to-Base Breakdown Voltage
V(BR)EBO
IE=10μA, IC=0A
6.5
V
Turn-ON Time
ton
See specified Test Circuit.
40
ns
Storage Time
tstg
920
ns
Fall Time
tf
32
ns
Switching Time Test Circuit
Ordering Information
Device
Package
Shipping
memo
2SC6095-TD-E
PCP
1,000pcs./reel
Pb Free
VR10
RB
VCC=40V
IC=10IB1= --10IB2=0.5A
VBE= --5V
+
+
50Ω
INPUT
OUTPUT
RL
470μF
100μF
PW=20μs
IB1
D.C.≤1%
IB2
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.



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