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S10040340 bảng dữ liệu(PDF) 2 Page - RF Micro Devices |
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S10040340 bảng dữ liệu(HTML) 2 Page - RF Micro Devices |
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2 / 3 page ![]() RF Micro Devices Inc. 7628 Thorndike Road, Greensboro, NC 27409-9421 DS140221 For sales or technical support, contact RFMD at +1.336.678.5570 or customerservice@rfmd.com. The information in this publication is believed to be accurate. However, no responsibility is assumed by RF Micro Devices, Inc. ("RFMD") for its use, nor for any infringement of patents or other rights of third parties resulting from its use. No license is granted by implication or otherwise under any patent or patent rights of RFMD. RFMD reserves the right to change component circuitry, recommended application circuitry and specifications at any time without prior notice. 2 of 3 S10040340 Nominal Operating Parameters Parameter Specification Unit Condition Min Typ Max General Performance V+ = 24V; TMB = 30°C; ZS = ZL = 75Ω Power Gain 34.0 dB f = 50MHz 34.5 36.5 dB f = 1000MHz Slope [1] 0.5 1.5 2.5 dB f = 40MHz to 1000MHz Flatness of Frequency Response 1.0 dB f = 40MHz to 1000MHz Input Return Loss 20.0 dB f = 40MHz to 160MHz 17.0 dB f = 160MHz to 870MHz 16.0 dB f = 870MHz to 1000MHz Output Return Loss 20.0 dB f = 40MHz to 160MHz 17.0 dB f = 160MHz to 870MHz 16.0 dB f = 870MHz to 1000MHz Noise Figure 4.5 dB f = 50MHz to 1000MHz Total Current Consumption (DC) 240.0 280.0 mA Distortion Data 40MHz to 750MHz V+ = 24V; TMB = 30°C; ZS = ZL = 75Ω CTB -66 -64 dBc 112 ch. flat, VO = 44dBmV [2] XMOD -60 -58 dBc CSO -65 -63 dBc 1. The slope is defined as the difference between the gain at the start frequency and the gain at the stop frequency. 2. 112 channels, NTSC frequency raster: 55.25MHz to 745.25MHz, +44dBmV flat output level. Composite Second Order (CSO) - The CSO parameter (both sum and difference products) is defined by the NCTA. Composite Triple Beat (CTB) - The CTB parameter is defined by the NCTA. Cross Modulation (XMOD) - Cross modulation (XMOD) is measured at baseband (selective voltmeter method), referenced to 100% modulation of the carrier being tested. |
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