RH117 datasheet(3/4 Pages) LINER

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RH117

SYMBOL

PARAMETER

CONDITIONS

NOTES

MIN

MAX

MIN

MAX

MIN

MAX

MIN

MAX

UNITS

IADJ

Adjust Pin Current

100

µA

I ADJ

Adjust Pin Current

10mA I OUT I MAX

µA

Change

2.5V (V IN – VOUT ) 40V,

µA

IOUT = 10mA

IMIN

Minimum Load

(VIN – VOUT ) = 40V

Current

Current Limit

(VIN – VOUT ) 15V

H Package

0.5

K Package

1.5

(VIN – VOUT ) = 40V

H Package

0.15

K Package

0.30

100KRAD(Si)

50KRAD(Si)

20KRAD(Si)

10KRAD(Si)

TABLE 1A: ELECTRICAL CHARACTERISTICS (Postirradiation) (Note 5)

Note 1: Unless otherwise specified, these specifications apply for

VIN – VOUT = 5V; and IOUT = 0.1A for the H package (TO-39) and

IOUT = 0.5A for the K package (TO-3) package. Although power dissipation

is internally limited, these specifications are applicable for power

dissipations of 2W for the TO-39 and 20W for the TO-3. IMAX is 0.5A for

the TO-39 and 1.5A for the TO-3.

Note 2: Regulation is measured at a constant junction temperature using

pulse testing with a low duty cycle. Changes in output voltage due to

heating effects are covered under the specification for thermal regulation.

Note 3: Guaranteed by design, characterization or correlation to other

tested parameters.

Note 4: TJ = 25°C unless otherwise noted.

Information furnished by Linear Technology Corporation is believed to be accurate and reliable.

However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen-

tation that the interconnection of its circuits as described herein will not infringe on existing patent rights.

TOTAL DOSE BIAS CIRCUIT

MIL-STD-883 TEST REQUIREMENTS

SUBGROUP

Final Electrical Test Requirements (Method 5004)

1*,2,3

Group A Test Requirements (Method 5005)

1,2,3

Group C and D End Point Electrical Parameters

(Method 5005)

* PDA Applies to subgroup 1. See PDA Test Notes.

PDA Test Notes

The PDA is specified as 5% based on failures from group A, subgroup 1,

tests after cooldown as the final electrical test in accordance with method

5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup

1, after burn-in divided by the total number of devices submitted for burn-

in in that lot shall be used to determine the percent for the lot.

Linear Technology Corporation reserves the right to test to tighter limits

than those given.

TABLE 2: ELECTRICAL TEST REQUIRE E TS

RH117

VIN

61.9

Ω

0.1

µF

ADJ

–15V

RH117 TA01

OUTPUT

15V

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