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IRHM2C50SE bảng dữ liệu(PDF) 1 Page - International Rectifier

tên linh kiện IRHM2C50SE
Giải thích chi tiết về linh kiện  TRANSISTOR N-CHANNEL(BVdss=600V, Rds(on)=0.60ohm, Id=10.4A)
PDF  4 Pages
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nhà sản xuất  IRF [International Rectifier]
Trang chủ  http://www.irf.com
Logo IRF - International Rectifier

IRHM2C50SE bảng dữ liệu(HTML) 1 Page - International Rectifier

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Product Summary
Part Number
BVDSS
RDS(on)
ID
IRHM2C50SE
600V
0.60
Ω
10.4A
IRHM7C50SE
Features:
n Radiation Hardened up to 1 x 105 Rads (Si)
n Single Event Burnout (SEB) Hardened
n Single Event Gate Rupture (SEGR) Hardened
n Gamma Dot (Flash X-Ray) Hardened
n Neutron Tolerant
n Identical Pre- and Post-Electrical Test Conditions
n Repetitive Avalanche Rating
n Dynamic dv/dt Rating
n Simple Drive Requirements
n Ease of Paralleling
n Hermetically Sealed
n Electrically Isolated
n Ceramic Eyelets
Absolute Maximum Ratings
Parameter
IRHM2C50SE, IRHM7C50SE
Units
ID @ VGS = 12V, TC = 25°C
Continuous Drain Current
10.4
ID @ VGS = 12V, TC = 100°C Continuous Drain Current
6.5
IDM
Pulsed Drain Current

41.6
PD @ TC = 25°C
Max. Power Dissipation
150
W
Linear Derating Factor
1.2
W/K
…
VGS
Gate-to-Source Voltage
±20
V
EAS
Single Pulse Avalanche Energy
‚
500
mJ
IAR
Avalanche Current

10.4
A
EAR
Repetitive Avalanche Energy

15
mJ
dv/dt
Peak Diode Recovery dv/dt
ƒ
3.0
V/ns
TJ
Operating Junction
-55 to 150
TSTG
Storage Temperature Range
Lead Temperature
300 (0.063 in (1.6 mm) from case for 10 sec)
Weight
9.3 (typical)
g
N-CHANNEL
SINGLE EVENT EFFECT (SEE) RAD HARD
Provisional Data Sheet No. PD-9.1252B
Pre-Radiation
600Volt, 0.60
Ω
Ω
Ω
Ω
Ω, (SEE) RAD HARD HEXFET
International Rectifier’s (SEE) RAD HARD technology
HEXFETs demonstrate virtual immunity to SEE fail-
ure. Additionally, under identical pre- and post-radia-
tion test conditions, International Rectifier’s RAD HARD
HEXFETs retain identical electrical specifications up
to 1 x 105 Rads (Si) total dose. No compensation in
gate drive circuitry is required.These devices are also
capable of surviving transient ionization pulses as high
as 1 x 1012 Rads (Si)/Sec, and return to normal opera-
tion within a few microseconds. Since the SEE pro-
cess utilizes International Rectifier’s patented HEXFET
technology, the user can expect the highest quality and
reliability in the industry.
RAD HARD HEXFET transistors also feature all of
the well-established advantages of MOSFETs, such
as voltage control, very fast switching, ease of paral-
leling and temperature stability of the electrical pa-
rameters. They are well-suited for applications such
as switching power supplies, motor controls, invert-
ers, choppers, audio amplifiers and high-energy pulse
circuits in space and weapons environments.
oC
A
REPETITIVE AVALANCHE AND dv/dt RATED
IRHM2C50SE
HEXFET® TRANSISTOR
IRHM7C50SE
Next Data Sheet
Index
Previous Datasheet
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