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AN3018 bảng dữ liệu(PDF) 13 Page - STMicroelectronics

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Giải thích chi tiết về linh kiện  Developing self tests for SPC564Ax
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AN3018 bảng dữ liệu(HTML) 13 Page - STMicroelectronics

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AN3018
Self tests for SPC564Ax core subsystem
Doc ID 16081 Rev 2
13/24
ECC, most notably the RAM. This capability is provided for two purposes:
It provides a software controlled mechanism for “injecting” errors into the
memories during data writes to verify the integrity of the ECC logic
It provides a mechanism to allow testing of the software service routines
associated with memory error logging
Result: after writing data with an erroneous ECC, the procedure involves reading back the
data and checking for error detection with the right parameters (single error, double error,
address of error).
Resource availability: once the RAM locations with erroneous content have been written,
the RAM is available for the application.
3.2.3
RAM address decoder
Principle: a specific test to check the RAM decoder can be implemented by inserting, at
several places in the RAM address space, data with known content. A signature using the
CRC unit of SPC564Ax can be computed by reading the RAM content at those places and
writing them in the CRC unit. The CRC can be seeded to any value by initializing the CRC
before the test.
Result: once the test is completed, the signature in the CRC unit can be compared with the
reference signature.
Resource availability: the RAM module is available during this test.
There is no restriction on the number of times the test can be performed.
3.2.4
eTPU code RAM
Principle: compute a signature over the eTPU code RAM during run time. Once enabled
(bits SCMMISEN=1 and bit VIS=0 in EPUTMCR register), this check is performed
continuously.
Result: the computed signature is automatically compared with a predefined signature in
EPTUMISCCMPR register. In case of mismatch, eTPU can also assert a global exception
interrupt indicating a global illegal state.
Resource availability: the eTPU code RAM is available during this test.
3.3
CPU parallel signature unit tests
The cores of SPC563Mx and of SPC564Ax devices have integrated signature registers to
enhance capabilities to develop core self tests.
To support applications requiring system integrity checking during operation, the Zen core
provides a parallel signature unit, which is capable of monitoring the CPU data read and
data write AHB buses, and accumulating a pair of 32-bit MISR signatures of the data values
transferred over these buses.



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