LCL8052ACPD datasheet(8/21 Pages) INTERSIL

8 / 21 page

5-13

System Electrical Speciﬁcations: ICL8068/ICL7104 V++ = +15V, V+ = +5V, V- = -15V, fCLOCK = 200kHz (Note 16)

PARAMETER

TEST

CONDITIONS

ICL8068A/ICL7104-14

ICL8068A/ICL7104-16

UNITS

MIN

TYP

MAX

MIN

TYP

MAX

Zero Input Reading

VIN = 0V, VREF = 2V

-00000

±00000 +00000 -00000 ±00000 +00000 Counts

Ratiometric Error (Note 13)

VIN = VREF = 2V

-1

LSB

Linearity Over

± Full Scale (Error of

Reading from Best Straight Line)

-4V

≤ VIN ≤ +4V

0.5

LSB

Differential Linearity (Difference

between Worst Case Step of Adjacent

Counts and Ideal Step)

-4V

≤ VIN ≤ +4V

0.01

LSB

Rollover Error (Difference in Reading

for Equal Positive & Negative Voltage

Near Full Scale)

-VIN = +VIN ≅ 4V

0.5

LSB

Noise (P-P Value Not Exceeded 95%

of Time)

VIN = 0V,

Full Scale = 4V

-2-

µV

Leakage Current at Input (Note 14)

VIN = 0V

100

165

100

165

Zero Reading Drift

VIN = 0V,

0oC to 70oC

0.5

µV/oC

Scale Factor Temperature Coefficient

(Note 15)

VIN = 4V,

0oC to 50oC

ext. ref. 0ppm/oC

ppm/oC

System Electrical Speciﬁcations: ICL8052/ICL7104 V++ = +15V, V+ = +5V, V- = -15V, fCLOCK = 200kHz (Note 16)

PARAMETER

TEST

CONDITIONS

ICL8052A/ICL7104-14

ICL8052A/ICL7104-16

UNITS

MIN

TYP

MAX

MIN

TYP

MAX

Zero Input Reading

VIN = 0V, VREF = 2V

-00000

±00000 +00000 -00000 ±00000 +00000 Counts

Ratiometric Error (Note 15)

VIN = VREF = 2V

-1

LSB

Linearity Over

± Full Scale (Error of

Reading from Best Straight Line)

-4V

≤ VIN ≤ +4V

0.5

LSB

Differential Linearity (Difference

between Worst Case Step of Adjacent

Counts and Ideal Step)

-4V

≤ VIN ≤ +4V

0.01

LSB

Rollover Error (Difference in Reading

for Equal Positive and Negative

Voltage Near Full Scale)

-VIN = +VIN ≈ 4V

0.5

LSB

Noise (Peak-to-Peak Value Not

Exceeded 95% of Time)

VIN = 0V,

Full Scale = 4V

-30-

µV

Leakage Current at Input (Note 14)

VIN = 0V

Zero Reading Drift

VIN = 0V,

0oC to 70oC

0.5

µV/oC

Scale Factor Temperature Coefficient

VIN = 4V,

0oC to 50oC

ext. ref. 0ppm/oC

ppm/oC

NOTES:

13. Tested with low dielectric absorption integrating capacitor.

14. The input bias currents are junction leakage currents which approximately double for every 10oC increase in the junction temperature,

TJ. Due to limited production test time, the input bias currents are measured with junctions at ambient temperature. In normal oper-

ation the junction temperature rises above the ambient temperature as a result of internal power dissipation, PD. TJ = TA + RθJAPD

where RθJA is the thermal resistance from junction to ambient. A heat sink can be used to reduce temperature rise.

15. The temperature range can be extended to 70oC and beyond if the Auto-Zero and Reference capacitors are increased to absorb the

high temperature leakage of the 8068. See note 14 above.

16. System Electrical Specifications are not tested; for reference only.

ICL8052/ICL7104, ICL8068/ICL7104

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