HT27LC512 datasheet(4/10 Pages) HOLTEK

4 / 10 page

Capacitance

Symbol

Parameter

Test Conditions

Min. Typ. Max. Unit

VCC

Conditions

CIN

Input Capacitance

3.3V

VIN=0V

—

COUT

Output Capacitance

3.3V

VOUT=0V

—

CVPP

VPP Capacitance

3.3V

VPP=0V

—

A.C. Characteristics

Read operation

Symbol

Parameter

Test Conditions

–120

Unit

VCC

Conditions

Min.

Max.

tACC

Address to Output Delay

3.3V CE=OE=VIL

—120

tCE

Chip Enable to Output Delay

3.3V OE=VIL

—120

tOE

Output Enable to Output Delay

3.3V CE=VIL

—45

tDF

CE or OE High to Output Float,

Whichever Occurred First

3.3V

—

tOH

Output Hold from Address, CE or

OE, Whichever Occurred First

3.3V

—

Programming operation

Ta=+25

°C±5°C

Symbol

Parameter

Test Conditions

Min. Typ. Max. Unit

VCC

Conditions

tAS

Address Setup Time

5.8V

—

µs

tOES

CE/VPP Setup Time

5.8V

—

µs

tOEH

OE/VPP Hold Time

5.8V

—

µs

tDS

Data Setup Time

5.8V

—

µs

tAH

Address Hold Time

5.8V

—

µs

tDH

Data Hold Time

5.8V

—

µs

tDFP

Output Enable to Output Float

Delay

5.8V

—

130

tPW

PGM Program Pulse Width

5.8V

—

105

µs

tVCS

VCC Setup Time

5.8V

—

µs

tDV

Data Valid From CE

5.8V

—

150

tVR

OE/VPP Recovery Time

5.8V

—

µs

HT27LC512

6th May ’99

HT27LC512 bảng dữ liệu(PDF) 4 Page - Holtek Semiconductor Inc

HT27LC512 bảng dữ liệu(HTML) 4 Page - Holtek Semiconductor Inc

Html Pages

1 2 3 4 5 6 7 8 9 10

bảng dữ liệu tải về

Link URL