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HT1602 bảng dữ liệu(PDF) 3 Page - Holtek Semiconductor Inc

tên linh kiện HT1602
Giải thích chi tiết về linh kiện  40 Dot Matrix LCD Segment Driver
PDF  6 Pages
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nhà sản xuất  HOLTEK [Holtek Semiconductor Inc]
Trang chủ  http://www.holtek.com
Logo HOLTEK - Holtek Semiconductor Inc

HT1602 bảng dữ liệu(HTML) 3 Page - Holtek Semiconductor Inc

  HT1602 Datasheet HTML 1Page - Holtek Semiconductor Inc HT1602 Datasheet HTML 2Page - Holtek Semiconductor Inc HT1602 Datasheet HTML 3Page - Holtek Semiconductor Inc HT1602 Datasheet HTML 4Page - Holtek Semiconductor Inc HT1602 Datasheet HTML 5Page - Holtek Semiconductor Inc HT1602 Datasheet HTML 6Page - Holtek Semiconductor Inc  
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Pad Description
Pad No.
Pad Name
I/O
Description
1~26
Y14~Y39
O
LCD driver outputs for segments*
27
DO39
O
Shift register output for the 40th bit data
28
DI20
I
Input data of shift register 2
29
DO19
O
Shift register output for the 20th bit data
30
VEE
I
LCD power supply
31, 32
V3, V2
I
LCD bias supply voltage
33
VSS
—
Negative power supply
34
VDD
—
Positive power supply
35
CLK
I
Clock pulse input for the shift register
36
DI0
I
Input data of shift register 1
37
LOAD
I
Latching signal to latch shift register data
38
ALT
I
Alternate input signal for LCD driving waveforms
39~52
Y0~Y13
O
LCD driver outputs for segments*
*: For Y0~Y39, any of VDD, V2, V3 or VEE can be selected as a display driving source according
to the combination of latched data level and ALT signal. Refer to the following table:
Latched Data
ALT
Display Data Output Level
H
HVEE
LVDD
L
HV3
LV2
Absolute Maximum Ratings*
Supply Voltage ................................. –0.3V to 6V
Storage Temperature................. –50
°C to 125°C
Input Voltage................. VSS–0.3V to VDD+0.3V
Operating Temperature............... –20
°C to 70°C
*Note: These are stress ratings only. Stresses exceeding the range specified under “Absolute Maxi-
mum Ratings” may cause substantial damage to the device. Functional operation of this
device at other conditions beyond those listed in the specification is not implied and prolonged
exposure to extreme conditions may affect device reliability.
HT1602
3
28th Aug ’98



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