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HAF1002S bảng dữ liệu(PDF) 3 Page - Hitachi Semiconductor

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HAF1002(L), HAF1002(S)
3
Electrical Characteristics (Ta = 25
°C)
Item
Symbol
Min
Typ
Max
Unit
Test Conditions
Drain current
I
D1
–7
——A
V
GS = –3.5V, VDS = –2V
Drain current
I
D2
—
—
–10
mA
V
GS = –1.2V, VDS = –2V
Drain to source breakdown
voltage
V
(BR)DSS
–60
—
—
V
I
D = –10mA, VGS = 0
Gate to source breakdown
voltage
V
(BR)GSS+
–16
—
—
V
I
G = –100µA, VDS = 0
Gate to source breakdown
voltage
V
(BR)GSS–
3
——V
I
G = 100µA, VDS = 0
Gate to source leak current
I
GSS+1
—
—
–100
µAV
GS = –8V, VDS = 0
I
GSS+2
—
—
–50
µAV
GS = –3.5V, VDS = 0
I
GSS+3
——–1
µAV
GS = –1.2V, VDS = 0
I
GSS–
—
—
100
µAV
GS = 2.4V, VDS = 0
Input current (shut down)
I
GS(op)1
—
–0.8
—
mA
V
GS = –8V, VDS = 0
I
GS(op)1
—
–0.35
—
mA
V
GS = –3.5V, VDS = 0
Zero gate voltege drain current I
DSS
—
—
–250
µAV
DS = –50 V, VGS = 0
Gate to source cutoff voltage
V
GS(off)
–1.1
—
–2.25
V
I
D = –1mA, VDS = –10V
Static drain to source on state
resistance
R
DS(on)
—
100
130
m
Ω
I
D = –7.5A, VGS = –4V
Note3
Static drain to source on state
resistance
R
DS(on)
—
7090m
Ω
I
D = –7.5A
V
GS = –10V
Note3
Forward transfer admittance
|y
fs|
5
10
—
S
I
D = –7.5A, VDS = –10V
Note3
Output capacitance
Coss
—
610
—
pF
V
DS = –10V , VGS = 0
f = 1 MHz
Turn-on delay time
t
d(on)
—
7.5
—
µsI
D = –7.5A, VGS = –5V
Rise time
t
r
—36
—
µsR
L = 4Ω
Turn-off delay time
t
d(off)
—32
—
µs
Fall time
t
f
—29
—
µs
Body–drain diode forward
voltage
V
DF
—
–1.0
—
V
I
F = –15A, VGS = 0
Body–drain diode reverse
recovery time
t
rr
—
200
—
ns
I
F = –15A, VGS = 0
diF/ dt =50A/
µs
Over load shut down
t
os1
—
3.7
—
ms
V
GS = –5V, VDD = –12V
operation time
Note4
t
os2
—1
—ms
V
GS = –5V, VDD = –24V
Note:
3. Pulse test
4. Including the junction temperature rise of the over loaded condition.
• See characteristics curve of HAF1001.



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