TUSB501 datasheet(6/17 Pages) TI

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Tdiff_LH

Tdiff_HL

OUT

24"

1"-6"

Up to 3m

(30AWG)

TUSB501

AWG

Jitter

Measurement

TUSB501

SLLSEG5A – AUGUST 2013 – REVISED AUGUST 2013

www.ti.com

AC ELECTRICAL CHARACTERISTICS (continued)

over operating free-air temperature range (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Timing

Apply 0 V to VCC, connect

Time from power applied until RX

SuperSpeed USB termination to

tREADY

termination

TX±, apply 3.3 V to VCC, and

measure when ZRX-DIFF is enabled.

Jitter

TJTX-EYE

Total jitter (1) (2)

0.213

UI (3)

EQ = Floating, OS = High,

DJTX

Deterministic jitter (2)

DE = High

0.197

UI (3)

See Figure 1.

RJTX

Random jitter (2) (4)

0.016

UI (3)

(1)

Includes RJ at 10

-12.

(2)

Measured at the ends of reference channel in Figure 1 with K28.5 pattern, VID = 1000 mVpp, 5 Gbps, -3.5 dB de-emphasis from source.

(3)

UI = 200 ps.

(4)

Rj calculated as 14.069 times the RMS random jitter for 10

-12 BER.

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PARAMETER MEASUREMENT INFORMATION

Figure 1. Jitter Measurement Setup

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Figure 2. Propagation Delay

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