XTR111

SBOS375C

– NOVEMBER 2006 – REVISED JUNE 2011

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PACKAGE

PRODUCT

PACKAGE-LEAD

DESIGNATOR

PACKAGE MARKING

DFN-10

DRC

BSV

XTR111

MSOP-10

DGQ

CCM

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the

device product folder at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1) (2)

Over operating free-air temperature range (unless otherwise noted)

XTR111

UNIT

+44

V

–0.5 to +14

V

V

Voltage at REGS, REGF, VIN, OD, EF

V

Voltage at REGF, VG

V

±25

mA

VG

REGF

Operating Temperature

–55 to +125

°C

Storage Temperature

–65 to +150

°C

Electrostatic Discharge Rating (HBM)

2000

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not supported.

(2)

Refer to the Package Option Addendum at the end of this document for lead temperature ratings.

(3)

Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails must

be current limited.

(4)

The IS pin current absolute maximum rating is +25mA and

–50mA.

(5)

See the following sections Explanation of Pin Functions, External MOSFET, and Voltage Regulator in Application Information regarding

safe voltage ranges and currents.

(6)

See text in Application Information regarding safe voltage ranges and currents.

2

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© 2006–2011, Texas Instruments Incorporated