LMP2021 datasheet(3/31 Pages) TI1

3 / 31 page

LMP2021, LMP2022

www.ti.com

SNOSAY9D – SEPTEMBER 2008 – REVISED JULY 2009

Operating Ratings

(1)

Temperature Range

−40°C to 125°C

Supply Voltage (VS = V

+ – V–)

2.2V to 5.5V

Package Thermal Resistance (

θJA)

5-Pin SOT-23

164 °C/W

8-Pin SOIC (LMP2021)

106 °C/W

8-Pin SOIC (LMP2022)

106 °C/W

8-Pin VSSOP

217 °C/W

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test

conditions, see the Electrical Characteristics Tables.

2.5V Electrical Characteristics

(1)

Unless otherwise specified, all limits are guaranteed for TA = 25°C, V

+ = 2.5V, V− = 0V, V

CM = V

+/2, R

L >10 kΩ to V

+/2.

Boldface limits apply at the temperature extremes.

Symbol

Parameter

Conditions

Min

Typ

Max

Units

(2)

(3)

(2)

VOS

Input Offset Voltage

–0.9

±5

μV

±10

TCVOS

Input Offset Voltage Drift (4)

0.001

±0.02

μV/°C

Input Bias Current

±23

±100

±300

IOS

Input Offset Current

±57

±200

±250

CMRR

Common Mode Rejection Ratio

−0.2V ≤ VCM ≤ 1.7V

105

141

≤ VCM ≤ 1.5V

102

CMVR

Input Common-Mode Voltage Range

Large Signal CMRR

≥ 105 dB

−0.2

1.7

Large Signal CMRR

≥ 102 dB

1.5

EMIRR

Electro-Magnetic Interference

VRF-PEAK = 100 mVP (−20 dBVP)

Rejection Ratio(5)

f = 400 MHz

VRF-PEAK = 100 mVP (−20 dBVP)

IN+

f = 900 MHz

and

VRF-PEAK = 100 mVP (−20 dBVP)

−

f = 1800 MHz

VRF-PEAK = 100 mVP (−20 dBVP)

f = 2400 MHz

PSRR

Power Supply Rejection Ratio

2.5V

≤ V+ ≤ 5.5V, VCM = 0

115

130

112

2.2V

≤ V+ ≤ 5.5V, VCM = 0

110

130

AVOL

Large Signal Voltage Gain

RL = 10 kΩ to V

+/2

124

150

VOUT = 0.5V to 2V

119

RL = 2 kΩ to V

+/2

120

150

VOUT = 0.5V to 2V

115

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables under

conditions of internal self-heating where TJ > TA.

(2)

All limits are guaranteed by testing, statistical analysis or design.

(3)

Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and

will also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production

material.

(4)

Offset voltage temperature drift is determined by dividing the change in VOS at the temperature extremes by the total temperature

change.

(5)

The EMI Rejection Ratio is defined as EMIRR = 20Log ( VRF-PEAK/ΔVOS).

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