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TL494CD bảng dữ liệu(PDF) 2 Page - Motorola, Inc

tên linh kiện TL494CD
Giải thích chi tiết về linh kiện  SWITCHMODE PULSE WIDTH MODULATION CONTROL CIRCUIT
PDF  12 Pages
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nhà sản xuất  MOTOROLA [Motorola, Inc]
Trang chủ  http://www.freescale.com
Logo MOTOROLA - Motorola, Inc

TL494CD bảng dữ liệu(HTML) 2 Page - Motorola, Inc

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TL494
2
MOTOROLA ANALOG IC DEVICE DATA
RECOMMENDED OPERATING CONDITIONS
Characteristics
Symbol
Min
Typ
Max
Unit
Power Supply Voltage
VCC
7.0
15
40
V
Collector Output Voltage
VC1, VC2
–
30
40
V
Collector Output Current (Each transistor)
IC1, IC2
–
–
200
mA
Amplified Input Voltage
Vin
–0.3
–
VCC – 2.0
V
Current Into Feedback Terminal
lfb
–
–
0.3
mA
Reference Output Current
lref
–
–
10
mA
Timing Resistor
RT
1.8
30
500
k
Ω
Timing Capacitor
CT
0.0047
0.001
10
µF
Oscillator Frequency
fosc
1.0
40
200
kHz
ELECTRICAL CHARACTERISTICS (VCC = 15 V, CT = 0.01 µF, RT = 12 kΩ, unless otherwise noted.)
For typical values TA = 25°C, for min/max values TA is the operating ambient temperature range that applies, unless otherwise noted.
Characteristics
Symbol
Min
Typ
Max
Unit
REFERENCE SECTION
Reference Voltage (IO = 1.0 mA)
Vref
4.75
5.0
5.25
V
Line Regulation (VCC = 7.0 V to 40 V)
Regline
–
2.0
25
mV
Load Regulation (IO = 1.0 mA to 10 mA)
Regload
–
3.0
15
mV
Short Circuit Output Current (Vref = 0 V)
ISC
15
35
75
mA
OUTPUT SECTION
Collector Off–State Current
(VCC = 40 V, VCE = 40 V)
IC(off)
–
2.0
100
µA
Emitter Off–State Current
VCC = 40 V, VC = 40 V, VE = 0 V)
IE(off)
–
–
–100
µA
Collector–Emitter Saturation Voltage (Note 2)
Common–Emitter (VE = 0 V, IC = 200 mA)
Emitter–Follower (VC = 15 V, IE = –200 mA)
Vsat(C)
Vsat(E)
–
–
1.1
1.5
1.3
2.5
V
Output Control Pin Current
Low State (VOC ≤ 0.4 V)
High State (VOC = Vref)
IOCL
IOCH
–
–
10
0.2
–
3.5
µA
mA
Output Voltage Rise Time
Common–Emitter (See Figure 12)
Emitter–Follower (See Figure 13)
tr
–
–
100
100
200
200
ns
Output Voltage Fall Time
Common–Emitter (See Figure 12)
Emitter–Follower (See Figure 13)
tf
–
–
25
40
100
100
ns
NOTE: 2. Low duty cycle pulse techniques are used during test to maintain junction temperature as close to ambient temperature as possible.



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