Preliminary

CAT33C804A

2

Doc. No. 25044-00 2/98

ABSOLUTE MAXIMUM RATINGS*

Temperature Under Bias ................. –55

°C to +125°C

Storage Temperature ....................... –65

°C to +150°C

Voltage on Any Pin with

Package Power Dissipation

°C) ................................... 1.0W

Lead Soldering Temperature (10 secs) ............ 300

°C

*COMMENT

Stresses above those listed under “Absolute Maximum

Ratings” may cause permanent damage to the device.

These are stress ratings only, and functional operation of

the device at these or any other conditions outside of those

listed in the operational sections of this specification is not

implied. Exposure to any absolute maximum rating for

extended periods may affect device performance and

reliability.

RELIABILITY CHARACTERISTICS

Symbol

Parameter

Min.

Max.

Units

Reference Test Method

Endurance

100,000

Cycles/Byte

MIL-STD-883, Test Method 1033

Data Retention

100

Years

MIL-STD-883, Test Method 1008

ESD Susceptibility

2000

Volts

MIL-STD-883, Test Method 3015

Latch-up

100

mA

JEDEC Standard 17

Note:

(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC

(2) Output shorted for no more than one second. No more than one output shorted at a time.

(3) This parameter is tested initially and after a design or process change that affects the parameter.

D.C. CHARACTERISTICS

±10%,unless otherwise specified.

Limits

Symbol

Parameter

Min.

Typ.

Max.

Units

Test Conditions

Power Supply Current

3

mA

(Operating)

DO is Unloaded.

Power Supply Current

250

(Standby)

DI = 0V, CLK = 0V

Input Low Voltage

–0.1

0.8

V

Input High Voltage

2

V

Output Low Voltage

0.4

V

Output High Voltage

2.4

V

µA

Input Leakage Current

2

Output Leakage Current

10