LPV521 datasheet(3/29 Pages) TI

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LPV521

www.ti.com

SNOSB14C – AUGUST 2009 – REVISED FEBRUARY 2013

1.8V DC Electrical Characteristics

(1)

Unless otherwise specified, all limits guaranteed for TA = 25°C, V

+ = 1.8V, V− = 0V, V

CM = VO = V

+/2, and R

L > 1 MΩ.

Boldface limits apply at the temperature extremes.

Min

Typ

Max

Symbol

Parameter

Conditions

Units

(2)

(3)

(2)

VOS

Input Offset Voltage

VCM = 0.3V

0.1

±1.0

±1.23

0.1

±1.0

VCM = 1.5V

±1.23

TCVOS

Input Offset Voltage Drift(4)

±0.4

±3

μV/°C

IBIAS

Input Bias Current

0.01

±1

±50

IOS

Input Offset Current

CMRR

Common Mode Rejection Ratio

≤ VCM ≤ 1.8V

101

≤ VCM ≤ 0.7V

120

1.2V

≤ VCM ≤ 1.8V

PSRR

Power Supply Rejection Ratio

1.6V

≤ V+ ≤ 5.5V

109

VCM = 0.3V

CMRR

≥ 67 dB

1.8

CMVR

Common Mode Voltage Range

CMRR

≥ 60 dB

1.8

VO = 0.5V to 1.3V

125

AVOL

Large Signal Voltage Gain

RL = 100 kΩ to V

+/2

Output Swing High

RL = 100 kΩ to V

+/2

VIN(diff) = 100 mV

mV from

either rail

Output Swing Low

RL = 100 kΩ to V

+/2

VIN(diff) = −100 mV

Sourcing, VO to V

–

VIN(diff) = 100 mV

0.5

Output Current(5)

Sinking, VO to V

VIN(diff) = −100 mV

0.5

Supply Current

VCM = 0.3V

345

400

580

472

600

VCM = 1.5V

850

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables under

conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the

device may be permanently degraded, either mechanically or electrically.

(2)

All limits are guaranteed by testing, statistical analysis or design.

(3)

Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and

will also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production

material.

(4)

The offset voltage average drift is determined by dividing the change in VOS at the temperature extremes by the total temperature

change.

(5)

The short circuit test is a momentary open loop test.

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