28

Field Name

Description

RES[1:0]

Sets resolution

00 = 400

01 = 800

10 = 1200

11 = 1600

AWAKE

0 = Normal operation with REST mode enable.

1 = Force Awake

RUN_Rate[2:0]

000 = 2ms

001 = 3ms

010 = 4ms

011 = 5ms

100 = 6ms

101 = 7ms

110 = 8ms

Above timing calculated base on 25MHz system clock,

they may change after actual measurement.

Self_Test

Address: 0x10

Access: Write

Reset Value: NA

Bit

76543210

Field

Reserved

Reserved

Reserved

Reserved

Reserved

Reserved

Reserved

TESTEN

Data Type: Bit field

USAGE : Before performing system self test, reset the chip. Then, set the TESTEN bit in register 0x10 to start the system

self test. The test takes 250ms. During this time, do not write or read through the SPI port. Results are available in the

CRC0-3 registers. After self-test, reset the chip again to start normal operation.

Field Name

Description

TESTEN

Enable System Self Test

0 = Disabled

1 = Enable

Reserved

Address: 0x11

Configuration2_bits

Address: 0x12

Access: Read/Write

Reset Value: 0x26

Bit

76543210

Field

0

Reserved

AWAKE

Data Type: Bit field

USAGE: Register 0x12 allows the user to change the configuration of the sensor. The RES bit allows selection between

400, 800, 1200 and 1600 cpi resolution.

PixArt Imaging Inc.

ADNS-7530 Integrated Molded Lead-Frame DIP Sensor

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PixArt Imaging Inc.