LMP2021 datasheet(4/31 Pages) TI

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LMP2021, LMP2022

SNOSAY9E – SEPTEMBER 2008 – REVISED MARGH 2013

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2.5V Electrical Characteristics

(1) (continued)

Unless otherwise specified, all limits are ensured for TA = 25°C, V

+ = 2.5V, V− = 0V, V

CM = V

+/2, R

L >10 kΩ to V

+/2. Boldface

limits apply at the temperature extremes.

Symbol

Parameter

Conditions

Min(2)

Typ(3)

Max(2)

Units

VOUT

Output Swing High

RL = 10 kΩ to V

+/2

RL = 2 kΩ to V

+/2

115

from either

Output Swing Low

RL = 10 kΩ to V

+/2

rail

RL = 2 kΩ to V

+/2

IOUT

Linear Output Current

Sourcing, VOUT = 2V

Sinking, VOUT = 0.5V

Supply Current

Per Amplifier

0.95

1.10

1.37

Slew Rate(6)

AV = +1, CL = 20 pF, RL = 10 kΩ

2.5

μs

VO = 2 VPP

GBW

Gain Bandwidth Product

CL = 20 pF, RL = 10 kΩ

MHz

Gain Margin

CL = 20 pF, RL = 10 kΩ

ΦM

Phase Margin

CL = 20 pF, RL = 10 kΩ

deg

CIN

Input Capacitance

Common Mode

Differential Mode

Input-Referred Voltage Noise Density f = 0.1 kHz or 10 kHz, AV = 1000

nV/

√Hz

f = 0.1 kHz or 10 kHz, AV = 100

Input-Referred Voltage Noise

0.1 Hz to 10 Hz

260

nVPP

0.01 Hz to 10 Hz

330

Input-Referred Current Noise

f = 1 kHz

350

fA/

√Hz

Recovery time

to 0.1%, RL = 10 kΩ, AV = −50,

µs

VOUT = 1.25 VPP Step, Duration = 50 μs

Cross Talk

LMP2022, f = 1 kHz

150

(6)

The number specified is the average of rising and falling slew rates and is measured at 90% to 10%.

5V Electrical Characteristics

(1)

Unless otherwise specified, all limits are ensured for TA = 25°C, V

+ = 5V, V− = 0V, V

CM = V

+/2, R

L > 10 kΩ to V

+/2. Boldface

limits apply at the temperature extremes.

Symbol

Parameter

Conditions

Min(2)

Typ(3)

Max(2)

Units

VOS

Input Offset Voltage

−0.4

±5

μV

±10

TCVOS

Input Offset Voltage Drift(4)

−0.004

±0.02

μV/°C

Input Bias Current

±25

±100

±300

IOS

Input Offset Current

±48

±200

±250

CMRR

Common Mode Rejection Ratio

−0.2V ≤ VCM ≤ 4.2V

120

139

≤ VCM ≤ 4.0V

115

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under

conditions of internal self-heating where TJ > TA.

(2)

All limits are specified by testing, statistical analysis or design.

(3)

Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and

will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production

material.

(4)

Offset voltage temperature drift is determined by dividing the change in VOS at the temperature extremes by the total temperature

change.

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