LM7321 datasheet(4/35 Pages) TI

4 / 35 page

LM7321, LM7322

SNOSAW8D – MAY 2008 – REVISED MARCH 2013

www.ti.com

2.7V Electrical Characteristics

(1) (continued)

Unless otherwise specified, all limits ensured for TA = 25°C, V

+ = 2.7V, V− = 0V, V

CM = 0.5V, VOUT = 1.35V, and RL > 1 MΩ to

1.35V. Boldface limits apply at the temperature extremes.

Min

Typ

Max

Symbol

Parameter

Condition

Units

(2)

(3)

(2)

GBW

Gain Bandwidth

f = 50 kHz

MHz

Input Referred Voltage Noise Density

f = 2 kHz

11.9

nV/

Input Referred Current Noise Density

f = 2 kHz

0.5

pA/

V+ = 1.9V, V− =

−0.8V

THD+N

Total Harmonic Distortion + Noise

f = 1 kHz, RL = 100 kΩ, AV = +2

−77

VOUT = 210 mVPP

CT Rej.

Crosstalk Rejection

f = 100 kHz, Driver RL = 10 kΩ

±5V Electrical Characteristics

(1)

Unless otherwise specified, all limited ensured for TA = 25°C, V

+ = 5V, V− = −5V, V

CM = 0V, VOUT = 0V, and RL > 1 MΩ to 0V.

Boldface limits apply at the temperature extremes.

Min

Typ

Max

Symbol

Parameter

Condition

Units

(2)

(3)

(2)

−5

±0.7

VOS

Input Offset Voltage

VCM = −4.5V and VCM = 4.5V

−6

VCM = −4.5V and VCM = 4.5V

TC VOS

Input Offset Voltage Temperature Drift

±2

µV/°C

(4)

VCM = −4.5V

−2.0

−1.2

(5)

−2.5

Input Bias Current

µA

VCM = 4.5V

0.45

1.0

(5)

1.5

200

IOS

Input Offset Current

VCM = −4.5V and VCM = 4.5V

300

100

−5V ≤ VCM ≤ 3V

CMRR

Common Mode Rejection Ratio

−5V ≤ VCM ≤ 5V

104

PSRR

Power Supply Rejection Ratio

2.7V

≤ VS ≤ 30V, VCM = −4.5V

−5.3

−5.1

−5.0

CMVR

Common Mode Voltage Range

CMRR > 50 dB

5.1

5.3

5.0

−4V ≤ VO ≤ 4V

RL = 10 kΩ to 0V

AVOL

Open Loop Voltage Gain

−4V ≤ VO ≤ 4V

RL = 2 kΩ to 0V

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical

tables under conditions of internal self-heating where TJ > TA.

(2)

All limits are ensured by testing or statistical analysis.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

(4)

Offset voltage temperature drift determined by dividing the change in VOS at temperature extremes into the total temperature change.

(5)

Positive current corresponds to current flowing into the device.

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