AD5520 datasheet(21/24 Pages) AD

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AD5520

Rev. B | Page 21 of 24

TYPICAL APPLICATION CIRCUIT

Figure 27 shows the AD5520 as in an ATE system. This device

can used as a per pin parametric unit in order to speed up the

rate at which testing can be done. It can also be used as a DUT

power supply, as shown in the application circuit.

The central PMU shown in the block diagram (Figure 27) is

usually a highly accurate PMU and is shared among a number

of pins in the tester. In general, many discrete levels are required

in an ATE system for the pin drivers, comparators, clamps, and

active loads. DAC devices, such as the AD5379, offer a highly

integrated solution for a number of these levels. The AD5379 is

a dense 40-channel DAC designed with high channel

requirements, such as ATE.

The flexible function of the AD5520 also makes it suited for use

in instrumentation applications such as source measure units.

Source measure units are programmable instruments capable of

sourcing and measuring voltage or current simultaneously. The

AD5520 provides a more integrated solution in such

equipment.

CENTRAL PMU

ADC

DAC

TIMING DATA

MEMORY

TIMING

GENERATOR

DLL, LOGIC

FORMATTER

DE-SKEW

DAC

VTERM

DRIVER

DAC

IOL

COMP

COMPARE

MEMORY

DAC

ACTIVE LOAD

DAC

VCOM

IOH

DAC

VTH

VTL

VCL

PPMU

ADC

DAC

DEVICE POWER

SUPPLIES

ADC

DAC

GND SENSE

GUARD

AMP

Ω COAX

RELAYS

DEVICE UNDER

TEST (DUT)

GUARD AMP

VCH

FORMATTER

DE-SKEW

Figure 27. Typical Application ATE Circuit

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