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06XSD200 bảng dữ liệu(PDF) 39 Page - Freescale Semiconductor, Inc

tên linh kiện 06XSD200
Giải thích chi tiết về linh kiện  Dual 6.0 mOhm High Side Switch
PDF  60 Pages
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nhà sản xuất  FREESCALE [Freescale Semiconductor, Inc]
Trang chủ  http://www.freescale.com
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06XSD200 bảng dữ liệu(HTML) 39 Page - Freescale Semiconductor, Inc

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Analog Integrated Circuit Device Data
Freescale Semiconductor
39
06XSD200
FUNCTIONAL DEVICE OPERATION
OPERATION AND OPERATING MODES
saved, thanks to an internal S/H capacitor. The SYNC pin
goes high (SYNC = 1). If the channel on which Track & Hold
current sensing is performed is changed to another, the
internal S/H hold capacitor is first emptied and then charged
again to allow current monitoring of the other channel.
Consequently, T&H current monitoring of a channel is lost
when this channel is in the Off state at the moment the
current is monitored on the other channel. Track & Hold mode
should not be used for frequencies below 60 Hz.
.
Figure 17. Current Sensing Ratio Versus Output Current
Current Sense Errors
Current sense accuracy is adversely affected by errors of
the internal circuitry’s current sense ratio and offset. The
value of the current sensing output current can be expressed
with sufficient accuracy by the following equation:
ICSNS = (I(HS[x])+ I_LOAD_ERR_SYS +
I_LOAD_Err_RAND)*CSRx
(1)
with CSR0 = (1/5000+GAIN0) and CSR1 = (1/
1666.6+
GAIN1).
The device’s offset error has a “systematic” and a
“random” component (I_LOAD_ERR_SYS, I_LOAD_ERR_RAND).
At low current levels, the random offset error may become
dominant. The systematic offset error is caused by
predictable variations with supply voltage and temperature,
and has a small but positive value with small spread. The
random offset error is a randomly distributed parameter with
an average value of zero, but with high spread. The random
offset error is subject to part-to-part variations and also
depends on the values of supply voltage and device
temperature. The device has a special feature called offset
compensation, allowing an almost complete compensation of
the random offset error (see ESR0_ERR). This offset
compensation technique greatly minimizes this error.
Computing the compensated current sensing value is
illustrated in the next sections.
Activation and Use of Offset Compensation
According to the settings of the OFP_s bit (in the
RETRYR_s register), opposite values of the random offset
error are generated. To compensate the random offset error,
two separate measurements with opposite values of the
random offset error are required. The measured values must
be saved by an external µ-processor. Compensation of the
random offset error is achieved by computing the average of
both. When a dedicated bit called Offset Positive (OFP = bit
D8 of the RETRYR_s register) is set to 1, the current sunk
through the CSNS pin (ICSNS) can be described by:
ICSNS1=CSRx *(ILOAD+ I_LOAD_ERR_SYS+
I_LOAD_ERR_RAND)(2)
When bit OFP is set to 0, ICSNS can be described by:
ICSNS2 = CSRx *(ILOAD+ I_LOAD_ERR_SYS -
I_LOAD_ERR_RAND)
(3)
The random offset term I_LOAD_ERR_RAND can be
computed from equations (2) and (3) as follows:
I_LOAD_ERR_RAND = (ICSNS1 - ICSNS2) / (2*CSRx)(4)
The compensated current sense value ICSNS,COMP can be
obtained by computing the average value of measurements
ICSNS1 and ICSNS2 as follows:
ICSNS,COMP = (ICSNS1 + ICSNS2) / 2
(5)
When equations 2 and 3 are substituted in equation 5, the
random offset error cancels out, as shows eq. 6:
ICSNS,COMP = (I_LOAD_ERR_SYS + ILOAD) * CSRx
(6)
The systematic offset error I_LOAD_ERR_SYS is referenced
at the operating point 28 V and 25 °C. It can eventually be
fine tuned by performing a calibration. Gain errors at 25 °C
(=current sense ratio errors, represented by
GAIN0 and
GAIN1) can also be reduced by performing a calibration at a
point in the range of interest. If calibration can not be done, it
is recommended to use the typical value of I_LOAD_ERR_SYS
(see ESR0_ERR).
Current Sense Error Model
The figures of uncompensated and compensated current
sense accuracy mentioned in Table 3 have been obtained
applying the error model of eq. 7 to the data:
ICSNS_MODEL = (I(HS[x])+ I_LOAD_ERR_SYS) * CSRx
(7)
ESRx_ERR = (ICSNS1 - ICSNS_MODEL)/ICSNS_MODEL
(8)
ESRx_ERR(COMP)= (ICSNS,COMP - ICSNS_MODEL)/
ICSNS_MODEL
(9)
The computation has been applied to each of the specified
measurement points. Model parameters I_LOAD_ERR_SYS and
CSRx have the nominal values, specified in ESR0_ERR.
The load current can be computed from this model as:
I(HS[x]) = ICSNS / CSRx - I_LOAD_ERR_SYS
(10)
I(HS[x]) = ICSNS,COMP / CSRx - I_LOAD_ERR_SYS
(11)



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