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ADP5063ACPZ-1-R7 bảng dữ liệu(PDF) 6 Page - Analog Devices |
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ADP5063ACPZ-1-R7 bảng dữ liệu(HTML) 6 Page - Analog Devices |
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6 / 44 page ![]() ADP5063 Data Sheet Rev. 0 | Page 6 of 44 Parameter Symbol Min Typ Max Unit Test Conditions/Comments LOGIC INPUT PINS Maximum Voltage on Digital Inputs VDIN_MAX 5.5 V Applies to SCL, SDA, DIG_IO1, DIG_IO2, DIG_IO3 Maximum Logic Low Input Voltage VIL 0.5 V Applies to SCL, SDA, DIG_IO1, DIG_IO2, DIG_IO3 Minimum Logic High Input Voltage VIH 1.2 V Applies to SCL, SDA, DIG_IO1, DIG_IO2, DIG_IO3 Pull-Down Resistance 215 350 610 kΩ Applies to DIG_IO1, DIG_IO2, DIG_IO3 1 Undervoltage lockout generated normally from ISO_Sx or ISO_Bx; in certain transition cases, it can be generated from VINx. 2 These values are programmable via I2C. Values are given with default register values. 3 The output current during charging may be limited by the input current limit or by the isothermal charging mode. 4 During weak charging mode, the charger provides at least 20 mA of charging current via the trickle charge branch to the battery unless trickle charging is disabled. Any residual current that is not required by the system is also used to charge the battery. 5 Either JEITA1 (default) or JEITA2 can be selected in I2C, or both JEITA functions can be enabled or disabled in I2C. RECOMMENDED INPUT AND OUTPUT CAPACITANCES Table 2. Parameter Symbol Min Typ Max Unit Test Conditions/Comments CAPACITANCES Effective capacitance VINx CVINx 4 10 μF CBP CCBP 60 100 140 nF ISO_Sx CISO_Sx 10 22 100 μF ISO_Bx CISO_Bx 10 22 μF I2C-COMPATIBLE INTERFACE TIMING SPECIFICATIONS Table 3. Parameter1 Symbol Min Typ Max Unit I2C-COMPATIBLE INTERFACE2 Capacitive Load for Each Bus Line CS 400 pF SCL Clock Frequency fSCL 400 kHz SCL High Time tHIGH 0.6 µs SCL Low Time tLOW 1.3 µs Data Setup Time tSU, DAT 100 ns Data Hold Time tHD, DAT 0 0.9 µs Setup Time for Repeated Start tSU, STA 0.6 µs Hold Time for Start/Repeated Start tHD, STA 0.6 µs Bus Free Time Between a Stop and a Start Condition tBUF 1.3 µs Setup Time for Stop Condition tSU, STO 0.6 µs Rise Time of SCL/SDA tR 20 300 ns Fall Time of SCL/SDA tF 20 300 ns Pulse Width of Suppressed Spike tSP 0 50 ns 1 Guaranteed by design. 2 A master device must provide a hold time of at least 300 ns for the SDA signal to bridge the undefined region of the falling edge of SCL (see Figure 2). |
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