CC1150-RTR1 datasheet(54/67 Pages) TI

54 / 67 page

CC1150

SWRS037A

Page 54 of 60

0x29: FSTEST – Frequency synthesizer calibration control

Bit

Field Name

Reset

R/W

Description

7:0

FSTEST[7:0]

87 (0x57)

R/W

For test only. Do not write to this register.

0x2A: PTEST – Production test

Bit

Field Name

Reset

R/W

Description

7:0

PTEST[7:0]

127

(0x7F)

R/W

Writing 0xBF to this register makes the on-chip temperature sensor

available in the IDLE state. The default 0x7F value should then be

written back before leaving the IDLE state. Other use of this register is

for test only.

0x2C: TEST2 – Various test settings

Bit

Field Name

Reset

R/W

Description

7:0

TEST2[7:0]

R/W

The value to use in this register is given by the SmartRF Studio [11]

software.

0x2D: TEST1 – Various test settings

Bit

Field Name

Reset

R/W

Description

7:0

TEST1[7:0]

(0x21)

R/W

The value to use in this register is given by the SmartRF Studio [11]

software.

0x2E: TEST0 – Various test settings

Bit

Field Name

Reset

R/W

Description

7:2

TEST0[7:2]

2(0x02)

R/W

The value to use in this register is given by the SmartRF Studio [11]

software.

VCO_SEL_CAL_EN

R/W

Enable VCO selection calibration stage when 1. The value to use in

this register is given by the SmartRF Studio [11] software.

TEST0[0]

R/W

The value to use in this register is given by the SmartRF Studio [11]

software.

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