ADC0834CCWMSLASHNOPB datasheet(4/40 Pages) TI

4 / 40 page

ADC0831-N, ADC0832-N, ADC0834-N, ADC0838-N

SNAS531B – AUGUST 1999 – REVISED MARCH 2013

www.ti.com

Converter and Multiplexer Electrical Characteristics

The following specifications apply for VCC = V+ = VREF = 5V, VREF ≤ VCC +0.1V, TA = Tj = 25°C, and fCLK = 250 kHz unless

otherwise specified. Boldface limits apply from TMIN to TMAX.

BCV, CCV, CCWM, BCN

CIWM Devices

and CCN Devices

Parameter

Conditions

Units

Tested

Design

Tested

Design

Typ(1)

Limit(2)

Limit(3)

Limit(2)

Limit(3)

CONVERTER AND MULTIPLEXER CHARACTERISTICS

ADC0838BCV

±½

ADC0834BCN

±½

Total

ADC0838CCV

±1

Unadjusted

VREF = 5.00 V

(4)

LSB (Max)

ADC0831/2/4/8CCN

±1

Error

ADC0831/2/4/8CCWM

±1

ADC0832/8CIWM

±1

Minimum Reference Input

3.5

1.3

3.5

1.3

Resistance(5)

Maximum Reference Input

3.5

5.9

3.5

5.4

5.9

Resistance(5)

Maximum Common-Mode Input

VCC

VCC+0.05

Range(6)

+0.05

Minimum Common-Mode Input

GND

Range(6)

−0.05

DC Common-Mode Error

±1/16

±¼

±1/16

±¼

LSB

15 mA into V+, VCC =

Change in zero error from VCC=5V

N.C.,

LSB

to internal zener operation(7)

VREF = 5V

VZ, internal diode

MIN 15 mA into V+

6.3

breakdown (at V+)(7)

MAX

8.5

Power Supply Sensitivity

VCC = 5V ± 5%

±1/16

±¼

±1/16

±¼

LSB

On Channel = 5V

−0.2

−1

μA

Off Channel = 0V

−1

IOFF, Off Channel Leakage

Current(8)

On Channel = 0V

+0.2

μA

Off Channel = 5V

On Channel = 0V

−0.2

−1

μA

Off Channel = 5V

−1

ION, On Channel Leakage Current

(8)

On Channel = 5V

+0.2

μA

Off Channel = 0V

(1)

Typicals are at 25°C and represent most likely parametric norm.

(2)

Tested limits are ensured to TI's AOQL (Average Outgoing Quality Level).

(3)

Ensured but not 100% production tested. These limits are not used to calculate outgoing quality levels.

(4)

Total unadjusted error includes offset, full-scale, linearity, and multiplexer errors.

(5)

Cannot be tested for ADC0832-N.

(6)

For VIN(−) ≥ VIN(+) the digital output code will be 0000 0000. Two on-chip diodes are tied to each analog input (see Functional Block

Diagram) which will forward conduct for analog input voltages one diode drop below ground or one diode drop greater than the VCC

supply. Be careful, during testing at low VCC levels (4.5V), as high level analog inputs (5V) can cause this input diode to

conduct—especially at elevated temperatures, and cause errors for analog inputs near full-scale. The spec allows 50 mV forward bias of

either diode. This means that as long as the analog VIN or VREF does not exceed the supply voltage by more than 50 mV, the output

code will be correct. To achieve an absolute 0 VDC to 5 VDC input voltage range will therefore require a minimum supply voltage of 4.950

VDC over temperature variations, initial tolerance and loading.

(7)

Internal zener diodes (6.3 to 8.5V) are connected from V+ to GND and VCC to GND. The zener at V+ can operate as a shunt regulator

and is connected to VCC via a conventional diode. Since the zener voltage equals the A/D's breakdown voltage, the diode insures that

VCC will be below breakdown when the device is powered from V+. Functionality is therefore ensured for V+ operation even though the

resultant voltage at VCC may exceed the specified Absolute Max of 6.5V. It is recommended that a resistor be used to limit the max

current into V+. (See Figure 24 in Functional Description)

(8)

Leakage current is measured with the clock not switching.

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Product Folder Links: ADC0831-N ADC0832-N ADC0834-N ADC0838-N

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