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S871 bảng dữ liệu(PDF) 4 Page - EPCOS |
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S871 bảng dữ liệu(HTML) 4 Page - EPCOS |
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4 / 27 page ![]() Reliability data according to AEC Q200, Rev. D Test Standard Test conditions ∆R 25/R25 (typical) Remarks High temperature exposure (storage) MIL-STD-202, method 108 Storage at T = 125 °C t = 1000 h < 2% No visible damage Biased humidity MIL-STD-202, method 103 T = 85 °C Relative humidity of air 85% t = 1000 h Test voltage max. 0.3 V DC on NTC1) < 2 % No visible damage Operational life MIL-STD-202, method 108 T = 125 °C t = 1000 h Test voltage max. 0.3 V DC on NTC1) < 2% No visible damage Temperature cycling JESD 22, method JA-104 Lower test temperature: 55 °C Upper test temperature: 125 °C 1000 cycles Dwell time: max. 30 min at each temperature Transition time in air: max. 1 min < 2% No visible damage Terminal strength (leaded) MIL-STD-202, method 211 Test leaded device integrity Condition A: 2.27 N2) < 1% No visible damage Mechanical shock MIL-STD-202, method 213, condition C Acceleration: 40 g 2) Pulse duration: 6 ms Number of bumps: 3, each direction < 1% No visible damage Vibration MIL-STD-202, method 204 Acceleration: 5 g t = 20 min 12 cycles in each of 3 directions Frequency range: 10 to 2000 Hz < 1% No visible damage 1) Self heating of the NTC thermistor must not exceed 0.2 K, steady state. Test conditions deviating from AEC Q200, Rev. D. 2) Deviating from AEC Q200, Rev. D. Note Contact of NTC thermistors with any liquids and solvents shall be prevented. It must be ensured that no water enters the NTC thermistors (e.g. through plug terminals). Avoid dewing and condensation unless thermistor is specified for these conditions. Temperature measurement B57871S Leaded NTC thermistors, lead spacing 2.5 mm S871 Page 4 of 27 Please read Cautions and warnings and Important notes at the end of this document. |
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