Reliability data according to AEC Q200, Rev. D

Test

Standard

Test conditions

∆R

(typical)

Remarks

High temperature

exposure (storage)

MIL-STD-202,

method 108

Storage at T = +125

°C

t = 1000 h

< 2%

No visible

damage

Operational life

MIL-STD-202,

method 108

1000 h / +125

°C

Test voltage max. 0.3 V DC on

< 2%

No visible

damage

Temperature

cycling

JESD 22,

method JA-104

Lower test temperature:

55

°C

Upper test temperature: 125

°C

1000 cycles

Dwell time: max. 30 min at each

temperature

Transition time in air: max. 1 min

< 2%

No visible

damage

Terminal strength

(leaded)

MIL-STD-202,

method 211

Test leaded device integrity

< 1%

No visible

damage

Mechanical shock

MIL-STD-202,

method 213,

condition C

Pulse duration: 6 ms

Number of bumps: 3, each

direction

< 1%

No visible

damage

Vibration

MIL-STD-202,

method 204

Acceleration: 5 g

t = 20 min

12 cycles in each of 3 directions

Frequency range: 10 to 2000 Hz

< 1%

No visible

damage

1) Self heating of the NTC thermistor must not exceed 0.2 K, steady state. Test conditions deviating from AEC Q200, Rev. D.

2) Deviating from AEC Q200, Rev. D.

Note

Contact of NTC thermistors with any liquids and solvents shall be prevented. It must be

ensured that no water enters the NTC thermistors (e.g. through plug terminals).

Avoid dewing and condensation unless thermistor is specified for these conditions.

Temperature measurement

B57560G, B57560G1

Glass-encapsulated sensors

G560/G1560

Page 5 of 22

Please read Cautions and warnings and

Important notes at the end of this document.