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STM32F107VCT6 bảng dữ liệu(PDF) 52 Page - STMicroelectronics

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STM32F107VCT6 bảng dữ liệu(HTML) 52 Page - STMicroelectronics

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Electrical characteristics
STM32F105xx, STM32F107xx
52/104
Doc ID 15274 Rev 6
5.3.9
Memory characteristics
Flash memory
The characteristics are given at TA = 40 to 105 °C unless otherwise specified.
Table 30.
Flash memory endurance and data retention
5.3.10
EMC characteristics
Susceptibility tests are performed on a sample basis during device characterization.
Table 29.
Flash memory characteristics
Symbol
Parameter
Conditions
Min(1)
Typ
Max(1)
1.
Guaranteed by design, not tested in production.
Unit
tprog
16-bit programming time
TA = –40 to +105 °C
40
52.5
70
µs
tERASE Page (1 KB) erase time
TA = –40 to +105 °C
20
40
ms
tME
Mass erase time
TA = –40 to +105 °C
20
40
ms
IDD
Supply current
Read mode
fHCLK = 72 MHz with 2 wait
states, VDD = 3.3 V
20
mA
Write / Erase modes
fHCLK = 72 MHz, VDD = 3.3 V
5mA
Power-down mode / Halt,
VDD = 3.0 to 3.6 V
50
µA
Vprog
Programming voltage
2
3.6
V
Symbol
Parameter
Conditions
Value
Unit
Min(1)
1.
Based on characterization, not tested in production.
Typ
Max
NEND
Endurance
TA = –40 to +85 °C (6 suffix versions)
TA = –40 to +105 °C (7 suffix versions)
10
kcycles
tRET
Data retention
1 kcycle(2) at TA = 85 °C
2.
Cycling performed over the whole temperature range.
30
Years
1 kcycle(2) at TA = 105 °C
10
10 kcycles(2) at TA = 55 °C
20



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