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BCL016B bảng dữ liệu(PDF) 1 Page - BeRex Corporation |
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BCL016B bảng dữ liệu(HTML) 1 Page - BeRex Corporation |
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1 / 5 page ![]() www.berex.com BeRex, Inc. 1735 North 1 st Street #302 San Jose, CA 95112 T: (408) 452-5595; F: (408) 452-5596 Nov. 2012 Specifications are subject to change without notice. ©BeRex 2012 Rev. 1.7 BCL016B SUPER LOW NOISE PHEMT CHIP (.15µm x 160µm) The BeRex BCL016B is a GaAs super low noise pHEMT with a nominal 0.15 micron gate length and 160 micron gate width making the product ideally suited for applications requiring very low noise and high associated gain, in frequencies of up to 40 GHz. The BCL016B offers high insertion gain and a low noise figure for broadband applications. The BCL016B is produced using state of the art metallization with SI3N4 passivation and is screened to assure reliability ELECTRICAL CHARACTERISTICS (Ta = 25° C) SYMBOL PARAMETER/TEST CONDITIONS TEST FREQ. MIN. TYPICAL Max. UNIT NF Noise Figure (Vds = 2V, Id = 10mA) 12 GHz 18 GHz 0.4 0.6 dB GA Associated Gain (Vds = 2V, Id = 10mA) 12 GHz 18 GHz 12.5 10.5 13.5 11.5 dB P1dB Output Power @ p1dB (Vds = 2V, Id = 10mA) 12 GHz 13 14.5 dBm IDSS Saturated Drain Current (Vgs = 0V, Vds = 2V) 50 mA GM Transconductance (Vds = 2V, Vgs = -0.3V) 120 mS VP Pinch-off Voltage (Vds = 2V, Id = 200µA) -0.7 V BVGD Gate-Drain Breakdown Voltage, (Ig = -200 µA, source open) 9 V BVGS Gate-Source Breakdown Voltage, (Ig = -200 µA, drain open) 6 V RTH Thermal Resistance, junction to back side (Au-Sn Eutectic Attach) 270 ° C/W PRODUCT FEATURES Low 0.4dB typical noise figure @12 GHz High 13.5dB Typical associated Gain @12 GHz High Pin of up to 20dBm 0.15 X 160 Micron Recessed Gate APPLICATIONS Commercial Military / Hi-Rel. Test & Measurement |
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