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ATS657LSHTN-T bảng dữ liệu(PDF) 13 Page - Allegro MicroSystems

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Giải thích chi tiết về linh kiện  The ATS657 includes an optimized Hall-effect sensing integrated circuit (IC) and rare earth pellet to create a user..
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ATS657LSHTN-T bảng dữ liệu(HTML) 13 Page - Allegro MicroSystems

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Dynamic, Self-Calibrating, Threshold-Detecting, Differential
Speed and Direction Hall-Effect Gear Tooth Sensor IC
ATS657
13
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
The device must be operated below the maximum junction tem-
perature of the device, TJ(max). Under certain combinations of
peak conditions, reliable operation may require derating supplied
power or improving the heat dissipation properties of the appli-
cation. This section presents a procedure for correlating factors
affecting operating TJ. (Thermal data is also available on the
Allegro MicroSystems Web site.)
The Package Thermal Resistance, RJA, is a figure of merit sum-
marizing the ability of the application and the device to dissipate
heat from the junction (die), through all paths to the ambient air.
Its primary component is the Effective Thermal Conductivity,
K, of the printed circuit board, including adjacent devices and
traces. Radiation from the die through the device case, RJC, is
a relatively small component of RJA. Ambient air temperature,
TA, and air motion are significant external factors, damped by
overmolding.
The effect of varying power levels (Power Dissipation, PD), can
be estimated. The following formulas represent the fundamental
relationships used to estimate TJ, at PD.
PD = VIN
× IIN
(1)
T = PD
× RJA
(2)
TJ = TA + ΔT
(3)
For example, given common conditions such as: TA= 25°C,
VCC = 12 V, ICC = 6.5 mA, and RJA = 126 °C/W, then:
PD = VCC
× ICC = 12 V × 6.5 mA = 78 mW
T = PD
× RJA = 78 mW × 126 °C/W = 9.8°C
TJ = TA + T = 25°C + 9.8°C = 34.8°C
A worst-case estimate, PD(max), represents the maximum allow-
able power level (VCC(max), ICC(max)), without exceeding
TJ(max), at a selected RJA and TA.
Example: Reliability for VCC at TA=150°C, package SH, using
single layer PCB.
Observe the worst-case ratings for the device, specifically:
RJA=126°C/W, TJ(max) =165°C, VCC(absmax)=24 V, and
ICC = 13 mA (Note: At maximum target frequency, ICC(LOW) =
8 mA, ICC(HIGH) = 16 mA, and maximum pulse widths, the result
is a duty cycle of 62.4% and a worst case mean ICC of 13 mA.)
Calculate the maximum allowable power level, PD(max). First,
invert equation 3:
T(max) = TJ(max) – TA = 165°C–150°C = 15°C
This provides the allowable increase to TJ resulting from internal
power dissipation. Then, invert equation 2:
PD(max) = T(max) ÷RJA =15°C÷126 °C/W=119mW
Finally, invert equation 1 with respect to voltage:
VCC(est) = PD(max) ÷ ICC= 119mW÷13mA=9.2 V
The result indicates that, at TA, the application and device can
dissipate adequate amounts of heat at voltages ≤VCC(est).
Compare VCC(est) to VCC(max). If VCC(est) ≤ VCC(max), then reli-
able operation between VCC(est) and VCC(max) requires enhanced
RJA. If VCC(est) ≥ VCC(max), then operation between VCC(est) and
VCC(max) is reliable under these conditions.
Power Derating



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