PRELIMINARY TECHNICAL DATA

AD5280/AD5282

REV PrE 12 MAR 02

9

Information contained in this Product Concept Data Sheet describes a product in the early definition stage. There is no guarantee that the information contained here will become a final

product in its present form. For latest information contact Walt Heinzer/Analog Devices, Santa Clara, CA. TEL 408 382-3107; FAX 408 382-2721; email; walt.heinzer@analog.com

TEST CIRCUITS

Figures 9 to 17 define the test conditions used in product specification

table.

Figure 9. Potentiometer Divider Nonlinearity error test circuit

(INL, DNL)

Figure 10. Resistor Position Nonlinearity Error (Rheostat

Operation; R-INL, R-DNL)

Figure 11. Wiper Resistance test Circuit

Figure 12. Power supply sensitivity test circuit (PSS, PSSR)

Figure 13. Inverting Gain test Circuit

Figure 14. Non-Inverting Gain test circuit

Figure 15. Gain Vs Frequency test circuit

Figure 16. Incremental ON Resistance Test Circuit

Figure 17. Common Mode Leakage current test circuit